19 October 2016 A new optical flat surface measurement method based on machine vision and deflectometry
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Proceedings Volume 10155, Optical Measurement Technology and Instrumentation; 101551X (2016) https://doi.org/10.1117/12.2246758
Event: International Symposium on Optoelectronic Technology and Application 2016, 2016, Beijing, China
Abstract
Phase Measuring Deflectometry(PMD) is a non-contact, high dynamic-range and full-field metrology which becomes a serious competitor to interferometry. However, the accuracy of deflectometry metrology is strongly influenced by the level of the calibrations. Our paper presents a calibration-based PMD method to test optical flat surface with a high accuracy. In our method, a pin-hole camera was set next to the LCD screen which is used to project sinusoidal fringes to the test flat. And the test flat was placed parallel to the direction of the LCD screen, which makes the geometry calibration process are simplified. The photogrammetric methods used in computer vision science was used to calibrate the pin-hole camera by using a checker pattern shown on another LCD display at six different orientations, the intrinsic parameters can be obtained by processing the obtained image of checker patterns. Further, by making the last orientation of checker pattern is aligned at the same position as the test optical flat, the algorithms used in this paper can obtain the mapping relationship between the CCD pixels and the subaperture coordinates on the test optical flat. We test a optical flat with a size of 50mm in diameter using our setup and algorithm. Our experimental results of optical flat figure from low to high order aberrations show a good agreement with that from the Fizeau interferometer.
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Kewei E., Kewei E., Dahai Li, Dahai Li, Lijie Yang, Lijie Yang, Guangrao Guo, Guangrao Guo, Mengyang Li, Mengyang Li, Xuemin Wang, Xuemin Wang, Tao Zhang, Tao Zhang, Zhao Xiong, Zhao Xiong, } "A new optical flat surface measurement method based on machine vision and deflectometry ", Proc. SPIE 10155, Optical Measurement Technology and Instrumentation, 101551X (19 October 2016); doi: 10.1117/12.2246758; https://doi.org/10.1117/12.2246758
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