19 October 2016 Error analysis of standard wave-front reconstruction based on spatial light modulator
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Proceedings Volume 10155, Optical Measurement Technology and Instrumentation; 101553M (2016) https://doi.org/10.1117/12.2247407
Event: International Symposium on Optoelectronic Technology and Application 2016, 2016, Beijing, China
Abstract
The invention of spatial light modulator (SLM) promotes the development of aspheric surface test. SLM has the advantage of real-time and low-cost in comparison with the etching computer-generated hologram(CGH) plate. The pixel-structure of SLM, which includes the pixel pitch, gray-level number and black matrix, has great significance on the reconstructed wave-front quality. In this paper, the effects of SLM pixel pitch, gray-level number and black matrix are analyzed by Fresnel diffraction theory and computer simulation. In the simulation, a concave spherical wave-front with a radius of 1000 mm is generated by the SLM with different pixel pitch, gray-level numbers and aperture ratios, respectively. The results show that the quality of the reconstructed wave-front gets poorer as the pixel pitch increases, the gray-level number decreases or the aperture ratio reduces. This work can guide the selection of the SLM in the aspheric surface test.
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Xiao Ma, Shijie Liu, Zhigang Zhang, Jianda Shao, "Error analysis of standard wave-front reconstruction based on spatial light modulator ", Proc. SPIE 10155, Optical Measurement Technology and Instrumentation, 101553M (19 October 2016); doi: 10.1117/12.2247407; https://doi.org/10.1117/12.2247407
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