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25 October 2016 Research overview on reliability of infrared focal plane array detector assemblies
Meng Chao; Wang Yang; Peng Jing
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Proceedings Volume 10157, Infrared Technology and Applications, and Robot Sensing and Advanced Control; 1015702 (2016) https://doi.org/10.1117/12.2243743
Event: International Symposium on Optoelectronic Technology and Application 2016, 2016, Beijing, China
Abstract
Infrared Detector Dewar Cooler Assembly (IDDCA) is the key component of infrared system, and the reliability of IDDCA determines the reliability of the system and affects the application of the system to a great extent. Reliability research is of great significance for the engineering application of IDDCA. In this paper, research progress of reliability model, failure modes, acceleration factors, and reliability tests on the assemblies are introduced. Optimizing process and life cycle cost during the manufacturing, and evaluating reliability relying on database are described. In addition, the main thought of reliability research on the assemblies is briefly analyzed. This provides a reference for the domestic reliability research of the assemblies.
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Meng Chao, Wang Yang, and Peng Jing "Research overview on reliability of infrared focal plane array detector assemblies", Proc. SPIE 10157, Infrared Technology and Applications, and Robot Sensing and Advanced Control, 1015702 (25 October 2016); https://doi.org/10.1117/12.2243743
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