22 December 2016 Critical current and electric transport properties of superconducting epitaxial Nb(Ti)N submicron structures
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Proceedings Volume 10175, Electron Technology Conference 2016; 101750R (2016) https://doi.org/10.1117/12.2258216
Event: Electron Technology Conference ELTE 2016, 2016, Wisla, Poland
Abstract
Critical current and current-voltage characteristics of epitaxial Nb(Ti)N submicron ultrathin structures were measured as function of temperature. For 700-nm-wide bridge we found current-driven vortex de-pinning at low temperatures and thermally activated flux flow closer to the transition temperature, as the limiting factors for the critical current density. For 100-nm-wide meander we observed combination of phase-slip activation and vortex-anti-vortex pair (VAP) thermal excitation. Our Nb(Ti)N meander structure demonstrates high de-pairing critical current densities ~107 A/cm2 at low temperatures, but the critical currents are much smaller due to presence of the local constrictions.
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A. Klimov, W. Słysz, M. Guziewicz, V. Kolkovsky, M. Węgrzecki, J. Bar, M. Marchewka, B. Seredyński, "Critical current and electric transport properties of superconducting epitaxial Nb(Ti)N submicron structures", Proc. SPIE 10175, Electron Technology Conference 2016, 101750R (22 December 2016); doi: 10.1117/12.2258216; https://doi.org/10.1117/12.2258216
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