22 December 2016 Selected electrical properties of high ohmic thick-film resistors
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Proceedings Volume 10175, Electron Technology Conference 2016; 1017514 (2016) https://doi.org/10.1117/12.2255914
Event: Electron Technology Conference ELTE 2016, 2016, Wisla, Poland
Results of fabrication as well as electrical and stability characterization of thick-film high ohmic resistors are described in this paper. Five commercially available resistive compositions with sheet resistance of 1, 10, and 100 MΩ/sq were applied. The best properties were obtained for the lowest sheet resistance pastes, for which voltage coefficient of resistance (VCR) was lower than 3 ppm/V and hot temperature coefficient of resistance (HTCR) below 50 ppm/°C. Effect of resistor length on sheet resistance and impact of termination material were analyzed. High voltage pulse stress at 2 kV had negligible influence on resistors’ properties.
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Arkadiusz Dąbrowski, Arkadiusz Dąbrowski, Adam Tatar, Adam Tatar, Andrzej Dziedzic, Andrzej Dziedzic, } "Selected electrical properties of high ohmic thick-film resistors", Proc. SPIE 10175, Electron Technology Conference 2016, 1017514 (22 December 2016); doi: 10.1117/12.2255914; https://doi.org/10.1117/12.2255914

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