16 June 2017 Front Matter: Volume 10179
Abstract
This PDF file contains the front matter associated with SPIE Proceedings Volume 10179, including the Title Page, Copyright information, Table of Contents, Introduction (if any), and Conference Committee listing.

The papers in this volume were part of the technical conference cited on the cover and title page. Papers were selected and subject to review by the editors and conference program committee. Some conference presentations may not be available for publication. Additional papers and presentation recordings may be available online in the SPIE Digital Library at SPIEDigitalLibrary.org.

The papers reflect the work and thoughts of the authors and are published herein as submitted. The publisher is not responsible for the validity of the information or for any outcomes resulting from reliance thereon.

Please use the following format to cite material from these proceedings:

Author(s), “Title of Paper,” in Window and Dome Technologies and Materials XV, edited by Brian J. Zelinski, Proceedings of SPIE Vol. 10179 (SPIE, Bellingham, WA, 2017) Seven-digit Article CID Number.

ISSN: 0277-786X

ISSN: 1996-756X (electronic)

ISBN: 9781510608597

ISBN: 9781510608603 (electronic)

Published by

SPIE

P.O. Box 10, Bellingham, Washington 98227-0010 USA

Telephone +1 360 676 3290 (Pacific Time) · Fax +1 360 647 1445

SPIE.org

Copyright © 2017, Society of Photo-Optical Instrumentation Engineers.

Copying of material in this book for internal or personal use, or for the internal or personal use of specific clients, beyond the fair use provisions granted by the U.S. Copyright Law is authorized by SPIE subject to payment of copying fees. The Transactional Reporting Service base fee for this volume is $18.00 per article (or portion thereof), which should be paid directly to the Copyright Clearance Center (CCC), 222 Rosewood Drive, Danvers, MA 01923. Payment may also be made electronically through CCC Online at copyright.com. Other copying for republication, resale, advertising or promotion, or any form of systematic or multiple reproduction of any material in this book is prohibited except with permission in writing from the publisher. The CCC fee code is 0277-786X/17/$18.00.

Printed in the United States of America.

Publication of record for individual papers is online in the SPIE Digital Library.

00212_psisdg10179_1017901_page_2_1.jpg

Paper Numbering: Proceedings of SPIE follow an e-First publication model. A unique citation identifier (CID) number is assigned to each article at the time of publication. Utilization of CIDs allows articles to be fully citable as soon as they are published online, and connects the same identifier to all online and print versions of the publication. SPIE uses a seven-digit CID article numbering system structured as follows:

  • The first five digits correspond to the SPIE volume number.

  • The last two digits indicate publication order within the volume using a Base 36 numbering system employing both numerals and letters. These two-number sets start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B … 0Z, followed by 10-1Z, 20-2Z, etc. The CID Number appears on each page of the manuscript.

Authors

Numbers in the index correspond to the last two digits of the seven-digit citation identifier (CID) article numbering system used in Proceedings of SPIE. The first five digits reflect the volume number. Base 36 numbering is employed for the last two digits and indicates the order of articles within the volume. Numbers start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B…0Z, followed by 10-1Z, 20-2Z, etc.

Aggarwal, Ishwar D., 06

Arida, Marvin-Ray, 0E

Baldwin, Lawrence, 0F

Baronowski, Meghan, 0F

Bayya, Shyam S., 06

Blalock, Todd, 0M

Blockburger, Clark, 0N

Boyd, Darryl A., 06

Brunelle, Matt, 0M

Busse, Lynda E., 06

Cambrea, Lee R., 0A, 0F

DeFisher, Scott, 0P

Felde, Nadja, 0D

Ferralli, Ian, 0M

Fess, Edward, 0Q

Frantz, Jesse A., 06

Gannon, John J., Jr., 0F, 0G

Goldman, Lee M., 0I, 0J

Goodrich, Steven M., 0A

Harris, Daniel C., 09, 0A, 0F, 0G

Isogai, Masafumi, 0L

Jang, Woo-Yong, 0E

Jha, Santosh, 0I, 0J

Johnson, Linda F., 0F

Joseph, Shay, 0D

Kashalikar, Uday, 0J

Kim, Woohong, 06

Ku, Zahyun, 0E

Kunkel, John D., 0F

Lallemant, Lucile, 0K

Lynch, Timothy, 0M

Lynn, Kelvin G., 04

Matthews, Greg, 0P, 0Q

McCloy, John S., 04

Medicus, Kate, 0M

Montgomery, Matthew, 0N

Myer, Brian, 0M

Neff, B., 0O

Parish, Mark V., 0A, 0F, 0G

Park, James, 0E

Pascucci, Marina R., 0A, 0F, 0G

Petit, Johan, 0K

Poston, William B., 0F

Ramisetty, Mohan, 0I, 0J

Ross, James, 0P, 0Q

Saleh, Muad, 04

Sanghera, Jasbinder S., 06

Sano, Masahiko, 0L

Sastri, Suri, 0I, 0J

Schröder, Sven, 0D

Shienmann, Arit, 0D

Smith, Mark, 0I

Stout, M., 0O

Thomas, M. E., 0B

Trost, Marcus, 0D

Urbas, Augustine M., 0E

Wen, Tzu-Chien, 0F

Zelmon, David E., 0F

Conference Committee

Symposium Chair

  • Donald A. Reago Jr., U.S. Army Night Vision & Electronic Sensors Directorate (United States)

Symposium Co-chair

  • Arthur A. Morrish, Raytheon Space and Airborne Systems (United States)

Conference Chair

  • Brian J. Zelinski, Raytheon Missile Systems (United States)

Conference Program Committee

  • Lee Cambrea, Naval Air Warfare Center Weapons Division (United States)

  • Rick Gentilman, Raytheon Integrated Defense Systems (United States)

  • Daniel C. Harris, Naval Air Warfare Center Weapons Division (United States)

  • John S. McCloy, Washington State University (United States)

  • Kate Medicus, Optimax Systems, Inc. (United States)

  • W. Howard Poisl, Raytheon Missile Systems (United States)

  • Richard Porter, Air Force Research Laboratory (United States)

  • Melissa Stout, II-VI Optical Systems (United States)

  • Michael E. Thomas, Johns Hopkins University Applied Physics Laboratory (United States)

  • Marc Tricard, Zygo Corporation (United States)

  • Ted Turnquist, Meller Optics, Inc. (United States)

  • Jue Wang, Corning Incorporated (United States)

  • Martin Winterling, UTC Aerospace Systems (United States)

Session Chairs

  • 1 New Applications of Infrared Materials and Technology

    Melissa Stout, II-VI Optical Systems (United States)

  • 2 Infrared Window and Dome Technology Overviews

    Brian J. Zelinski, Raytheon Missile Systems (United States)

  • 3 Optical/Electrical Properties of Infrared Window and Dome Materials

    Daniel C. Harris, Naval Air Warfare Center Weapons Division (United States)

  • 4 Advances in Mid-wavelength Infrared Window and Dome Materials

    W. Howard Poisl, Raytheon Missile Systems (United States)

  • 5 Infrared Window and Dome Processing and Manufacturing Technology I

    Marc Tricard, Zygo Corporation (United States)

  • 6 Infrared Window and Dome Processing and Manufacturing II

    Marc Tricard, Zygo Corporation (United States)

  • 7 Testing and Modeling of Environmental Damage

    Ted Turnquist, Meller Optics, Inc. (United States)

© (2017) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
} "Front Matter: Volume 10179", Proc. SPIE 10179, Window and Dome Technologies and Materials XV, 1017901 (16 June 2017); doi: 10.1117/12.2280577; https://doi.org/10.1117/12.2280577
PROCEEDINGS
8 PAGES


SHARE
Back to Top