1 May 2017 Towards brilliant, compact x-ray sources: a new x-ray photonic device
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General Electric has designed an innovative x-ray photonic device that concentrates a polychromatic beam of diverging x-rays into a less divergent, parallel, or focused x-ray beam. The device consists of multiple, thin film multilayer stacks. X-rays incident on a given multilayer stack propagate within a high refractive index transmission layer while undergoing multiple total internal reflections from a novel, engineered multilayer containing materials of lower refractive index. Development of this device could lead to order-of-magnitude flux density increases, over a large broadband energy range from below 20 keV to above 300 keV. In this paper, we give an overview of the device and present GE’s progress towards fabricating prototype devices.
© (2017) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Brian Scherer, Brian Scherer, Sudeep Mandal, Sudeep Mandal, Joshua Salisbury, Joshua Salisbury, Peter Edic, Peter Edic, Forrest Hopkins, Forrest Hopkins, Susanne M. Lee, Susanne M. Lee, } "Towards brilliant, compact x-ray sources: a new x-ray photonic device", Proc. SPIE 10187, Anomaly Detection and Imaging with X-Rays (ADIX) II, 101870G (1 May 2017); doi: 10.1117/12.2266793; https://doi.org/10.1117/12.2266793

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