Optical frequency domain reflectometry for aerospace applications

Stephen T. Kreger; Osgar John Ohanian III; Naman Garg; Matthew A. Castellucci; Dan Kominski; Nur Aida Abdul Rahim; Matthew A. Davis; Noah B. Beaty; James W. Jeans; Emily H. Templeton; J. R. Pedrazzani

doi:10.1117/12.2262845

27 April 2017 Optical frequency domain reflectometry for aerospace applications

Stephen T. Kreger, Osgar John Ohanian III, Naman Garg, Matthew A. Castellucci, Dan Kominski, Nur Aida Abdul Rahim, Matthew A. Davis, Noah B. Beaty, James W. Jeans, Emily H. Templeton, J. R. Pedrazzani

Author Affiliations +

Proceedings Volume 10208, Fiber Optic Sensors and Applications XIV; 1020803 (2017) https://doi.org/10.1117/12.2262845
Event: SPIE Commercial + Scientific Sensing and Imaging, 2017, Anaheim, CA, United States

Abstract

Optical Frequency Domain Reflectometry (OFDR) is the basis of an emerging high-definition distributed fiber optic sensing (HD-FOS) technique that provides an unprecedented combination of resolution and sensitivity. We examine aerospace applications that benefit from HD-FOS, such as for defect detection, FEA model verification, and structural health monitoring. We describe how HD-FOS is used in applications spanning the full design chain, review progress with sensor response calibration and certification, and examine the challenges of data management through the use of event triggering, synchronizing data acquisition with control signals, and integrating the data output with established industry protocols and acquisition systems.

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Stephen T. Kreger, Osgar John Ohanian III, Naman Garg, Matthew A. Castellucci, Dan Kominski, Nur Aida Abdul Rahim, Matthew A. Davis, Noah B. Beaty, James W. Jeans, Emily H. Templeton, and J. R. Pedrazzani "Optical frequency domain reflectometry for aerospace applications", Proc. SPIE 10208, Fiber Optic Sensors and Applications XIV, 1020803 (27 April 2017); https://doi.org/10.1117/12.2262845

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