This PDF file contains the front matter associated with SPIE Proceedings Volume 10220, including the Title Page, Copyright information, Table of Contents, Introduction (if any), and Conference Committee listing.

The papers in this volume were part of the technical conference cited on the cover and title page. Papers were selected and subject to review by the editors and conference program committee. Some conference presentations may not be available for publication. Additional papers and presentation recordings may be available online in the SPIE Digital Library at SPIEDigitalLibrary.org.

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Please use the following format to cite material from these proceedings:

Author(s), “Title of Paper,” in Dimensional Optical Metrology and Inspection for Practical Applications VI, edited by Kevin G. Harding, Song Zhang, Proceedings of SPIE Vol. 10220 (SPIE, Bellingham, WA, 2017) Seven-digit Article CID Number.

ISSN: 0277-786X

ISSN: 1996-756X (electronic)

ISBN: 9781510609419

ISBN: 9781510609426 (electronic)

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  • The last two digits indicate publication order within the volume using a Base 36 numbering system employing both numerals and letters. These two-number sets start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B … 0Z, followed by 10-1Z, 20-2Z, etc. The CID Number appears on each page of the manuscript.


Numbers in the index correspond to the last two digits of the seven-digit citation identifier (CID) article numbering system used in Proceedings of SPIE. The first five digits reflect the volume number. Base 36 numbering is employed for the last two digits and indicates the order of articles within the volume. Numbers start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B…0Z, followed by 10-1Z, 20-2Z, etc.

Álvarez-Tamayo, R. I., 06

An, Yatong, 05

Barcelata-Pinzon, A., 06

Brahm, Anika, 0P

Breitbarth, Andreas, 07

Bromberg, Vadim, 0I

Durán-Sánchez, M., 06

Harding, Kevin, 0E, 0I, 0J

Heist, Stefan, 08, 0P

Hyun, Jae-Sang, 04

Jiang, Chufan, 09

Juarez-Salazar, R., 06

Kelly, Damien P., 0B, 0F

Kühmstedt, Peter, 08, 0P

Meneses-Fabian, C., 06

Moreno-Guzmán, J., 06

Navarro-Ahuatl, M. A., 06

Nguyen, Hieu, 03

Notni, Gunther, 07, 08, 0P

Ramamurthy, Rajesh, 0E, 0J

Ramm, Roland, 0P

Rangel-Romero, C., 06

Rosenberger, Maik, 07

Rulff, Christian, 0P

Ryle, James, 0B

Schurig, Florian, 0F

Sheridan, John T., 0B

Wang, Zhaoyang, 03

Zhang, Chen, 07

Zhang, Song, 04, 05, 09

Zhao, Liang, 0B

Conference Committee

Symposium Chair

  • Majid Rabbani, Rochester Institute of Technology (United States)

Symposium Co-chair

  • Robert Fiete, Harris Corporation (United States)

Conference Chairs

  • Kevin G. Harding, GE Global Research (United States)

  • Song Zhang, Purdue University (United States)

Conference Co-chair

  • Edward W. Reutzel, Pennsylvania State University (United States)

Conference Program Committee

  • Harbans S. Dhadwal, Omnitek Partners, LLC (United States)

  • Motoharu Fujigaki, University of Fukui (Japan)

  • Khaled J. Habib, Kuwait Institute for Scientific Research (Kuwait)

  • Damien P. Kelly, Technische Universität Ilmenau (Germany)

  • Peter Kühmstedt, Fraunhofer-Institut für Angewandte Optik und Feinmechanik (Germany)

  • Rongguang Liang, College of Optical Sciences, The University of Arizona (United States)

  • Georges T. Nehmetallah, The Catholic University of America (United States)

  • Gunther Notni, Fraunhofer-Institut für Angewandte Optik und Feinmechanik (Germany)

  • Lei Tian, Boston University (United States)

  • Joseph D. Tobiason, Micro Encoder Inc. (United States)

  • Zhaoyang Wang, The Catholic University of America (United States)

  • Jiangtao Xi, University of Wollongong (Australia)

Session Chairs

  • 1 Metrology and 3D Methods

    Kevin G. Harding, GE Global Research (United States)

  • 2 Metrology Analysis

    Song Zhang, Purdue University (United States)

  • 3 Metrology Applications I

    Song Zhang, Purdue University (United States)

  • 4 Metrology Applications II

    Damien P. Kelly, University College Dublin (Ireland)

© (2017) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
"Front Matter: Volume 10220", Proc. SPIE 10220, Dimensional Optical Metrology and Inspection for Practical Applications VI, 1022001 (16 June 2017); doi: 10.1117/12.2280894; https://doi.org/10.1117/12.2280894

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