Design and implementation of an electronic system to real-time capture and processing speckle interference patterns

A. Barcelata-Pinzon; C. Meneses-Fabian; R. Juarez-Salazar; J. Moreno-Guzmán; M. Durán-Sánchez; R. I. Álvarez-Tamayo; C. Rangel-Romero; M. A. Navarro-Ahuatl

doi:10.1117/12.2262722

1 May 2017 Design and implementation of an electronic system to real-time capture and processing speckle interference patterns

A. Barcelata-Pinzon, C. Meneses-Fabian, R. Juarez-Salazar, J. Moreno-Guzmán, M. Durán-Sánchez, R. I. Álvarez-Tamayo, C. Rangel-Romero, M. A. Navarro-Ahuatl

Author Affiliations +

Proceedings Volume 10220, Dimensional Optical Metrology and Inspection for Practical Applications VI; 1022006 (2017) https://doi.org/10.1117/12.2262722
Event: SPIE Commercial + Scientific Sensing and Imaging, 2017, Anaheim, CA, United States

Abstract

The design and implementation of an electronic system to real-time capture and processing speckle interference patterns is presented. Because of the random and instability speckle patterns nature, is very useful a system wich allows obtaining and visualizing interference speckle patterns in the shortest time possible. Proposed system captures the first speckle pattern as steady image while captures subsequent patterns from the same source. Images are electronically transformed separately into value arrays and subtracted to obtain real-time interference speckle patterns, these patterns are automatically archived for later analysis. System consist of a CCD camera, a computer interface that makes capturing, a transparent object and a 4f interferometric system whose source is a laser that passes through diffuser glass in order to obtain speckle effect. Experimental results and analytic explanation is showed bellow.

Conference Presentation

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A. Barcelata-Pinzon, C. Meneses-Fabian, R. Juarez-Salazar, J. Moreno-Guzmán, M. Durán-Sánchez, R. I. Álvarez-Tamayo, C. Rangel-Romero, and M. A. Navarro-Ahuatl "Design and implementation of an electronic system to real-time capture and processing speckle interference patterns", Proc. SPIE 10220, Dimensional Optical Metrology and Inspection for Practical Applications VI, 1022006 (1 May 2017); https://doi.org/10.1117/12.2262722

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