PROCEEDINGS VOLUME 10224
THE INTERNATIONAL CONFERENCE ON MICRO- AND NANO-ELECTRONICS 2016 | 3-7 OCTOBER 2016
International Conference on Micro- and Nano-Electronics 2016
THE INTERNATIONAL CONFERENCE ON MICRO- AND NANO-ELECTRONICS 2016
3-7 October 2016
Zvenigorod, Russian Federation
Front Matter: Volume 10224
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 1022401 (24 January 2017); doi: 10.1117/12.2270028
Micro- and Nanoelectronic Materials and Films I
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 1022402 (30 December 2016); doi: 10.1117/12.2266784
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 1022403 (30 December 2016); doi: 10.1117/12.2267053
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 1022404 (30 December 2016); doi: 10.1117/12.2264789
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 1022405 (30 December 2016); doi: 10.1117/12.2266862
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 1022406 (30 December 2016); doi: 10.1117/12.2267129
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 1022407 (30 December 2016); doi: 10.1117/12.2266504
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 1022408 (30 December 2016); doi: 10.1117/12.2267083
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 1022409 (30 December 2016); doi: 10.1117/12.2266012
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 102240A (30 December 2016); doi: 10.1117/12.2267059
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 102240B (30 December 2016); doi: 10.1117/12.2267172
Micro- and Nanoelectronic Materials and Films II
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 102240C (30 December 2016); doi: 10.1117/12.2266075
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 102240D (30 December 2016); doi: 10.1117/12.2266436
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 102240E (30 December 2016); doi: 10.1117/12.2264593
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 102240F (30 December 2016); doi: 10.1117/12.2267157
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 102240G (30 December 2016); doi: 10.1117/12.2266801
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 102240H (30 December 2016); doi: 10.1117/12.2267147
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 102240I (30 December 2016); doi: 10.1117/12.2267071
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 102240J (30 December 2016); doi: 10.1117/12.2267148
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 102240K (30 December 2016); doi: 10.1117/12.2267126
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 102240L (30 December 2016); doi: 10.1117/12.2267052
Physics of Micro- and Nanodevices
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 102240M (30 December 2016); doi: 10.1117/12.2267243
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 102240N (30 December 2016); doi: 10.1117/12.2267074
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 102240O (30 December 2016); doi: 10.1117/12.2266863
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 102240P (30 December 2016); doi: 10.1117/12.2266470
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 102240Q (30 December 2016); doi: 10.1117/12.2266244
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 102240R (30 December 2016); doi: 10.1117/12.2267241
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 102240S (30 December 2016); doi: 10.1117/12.2266275
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 102240T (30 December 2016); doi: 10.1117/12.2267084
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 102240U (30 December 2016); doi: 10.1117/12.2266762
Modeling and Simulation
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 102240V (30 December 2016); doi: 10.1117/12.2265988
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 102240W (30 December 2016); doi: 10.1117/12.2266775
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 102240X (30 December 2016); doi: 10.1117/12.2267032
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 102240Y (30 December 2016); doi: 10.1117/12.2267088
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 102240Z (30 December 2016); doi: 10.1117/12.2266628
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 1022410 (30 December 2016); doi: 10.1117/12.2266551
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 1022411 (30 December 2016); doi: 10.1117/12.2266868
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 1022412 (30 December 2016); doi: 10.1117/12.2267086
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 1022413 (30 December 2016); doi: 10.1117/12.2265659
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 1022414 (30 December 2016); doi: 10.1117/12.2267145
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 1022415 (30 December 2016); doi: 10.1117/12.2267161
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 1022416 (30 December 2016); doi: 10.1117/12.2266864
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 1022417 (30 December 2016); doi: 10.1117/12.2267143
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 1022418 (30 December 2016); doi: 10.1117/12.2266880
Micro- and Nanoelectromechanical Systems
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 1022419 (30 December 2016); doi: 10.1117/12.2267093
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 102241A (30 December 2016); doi: 10.1117/12.2266439
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 102241B (30 December 2016); doi: 10.1117/12.2266766
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 102241C (30 December 2016); doi: 10.1117/12.2266750
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 102241D (30 December 2016); doi: 10.1117/12.2267115
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 102241E (30 December 2016); doi: 10.1117/12.2266562
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 102241F (30 December 2016); doi: 10.1117/12.2267079
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 102241G (30 December 2016); doi: 10.1117/12.2267072
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 102241H (30 December 2016); doi: 10.1117/12.2267073
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 102241I (30 December 2016); doi: 10.1117/12.2267082
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 102241J (30 December 2016); doi: 10.1117/12.2267095
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 102241K (30 December 2016); doi: 10.1117/12.2267099
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 102241L (30 December 2016); doi: 10.1117/12.2266783
Micro- and Nanoelectronic Technologies I
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 102241M (30 December 2016); doi: 10.1117/12.2264691
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 102241N (30 December 2016); doi: 10.1117/12.2265336
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 102241O (30 December 2016); doi: 10.1117/12.2267125
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 102241P (30 December 2016); doi: 10.1117/12.2266347
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 102241Q (30 December 2016); doi: 10.1117/12.2264436
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 102241R (30 December 2016); doi: 10.1117/12.2266747
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 102241S (30 December 2016); doi: 10.1117/12.2267128
Micro- and Nanoelectronic Technologies II
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 102241T (30 December 2016); doi: 10.1117/12.2267146
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 102241U (30 December 2016); doi: 10.1117/12.2266348
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 102241V (30 December 2016); doi: 10.1117/12.2267112
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 102241W (30 December 2016); doi: 10.1117/12.2266715
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 102241X (30 December 2016); doi: 10.1117/12.2266626
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 102241Y (30 December 2016); doi: 10.1117/12.2267138
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 102241Z (30 December 2016); doi: 10.1117/12.2267120
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 1022420 (30 December 2016); doi: 10.1117/12.2267113
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 1022421 (30 December 2016); doi: 10.1117/12.2266471
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 1022422 (30 December 2016); doi: 10.1117/12.2266553
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 1022423 (30 December 2016); doi: 10.1117/12.2267064
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 1022424 (30 December 2016); doi: 10.1117/12.2266944
Metrology and Diagnostics
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 1022425 (30 December 2016); doi: 10.1117/12.2266634
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 1022426 (30 December 2016); doi: 10.1117/12.2265570
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 1022427 (30 December 2016); doi: 10.1117/12.2267058
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 1022428 (30 December 2016); doi: 10.1117/12.2250118
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 1022429 (30 December 2016); doi: 10.1117/12.2267173
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 102242A (30 December 2016); doi: 10.1117/12.2266745
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 102242B (30 December 2016); doi: 10.1117/12.2267090
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 102242C (30 December 2016); doi: 10.1117/12.2266889
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 102242D (30 December 2016); doi: 10.1117/12.2266838
Quantum Informatics
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 102242E (30 December 2016); doi: 10.1117/12.2263854
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 102242F (30 December 2016); doi: 10.1117/12.2264353
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 102242G (30 December 2016); doi: 10.1117/12.2266849
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 102242H (30 December 2016); doi: 10.1117/12.2266858
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 102242I (30 December 2016); doi: 10.1117/12.2267133
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 102242J (30 December 2016); doi: 10.1117/12.2266829
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 102242K (30 December 2016); doi: 10.1117/12.2267244
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 102242L (30 December 2016); doi: 10.1117/12.2267094
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 102242M (30 December 2016); doi: 10.1117/12.2267246
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 102242N (30 December 2016); doi: 10.1117/12.2266937
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 102242O (30 December 2016); doi: 10.1117/12.2267029
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 102242P (30 December 2016); doi: 10.1117/12.2266891
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 102242Q (30 December 2016); doi: 10.1117/12.2266853
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 102242R (30 December 2016); doi: 10.1117/12.2266800
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 102242S (30 December 2016); doi: 10.1117/12.2267077
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 102242T (30 December 2016); doi: 10.1117/12.2267102
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 102242U (30 December 2016); doi: 10.1117/12.2266754
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 102242V (30 December 2016); doi: 10.1117/12.2266847
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 102242W (30 December 2016); doi: 10.1117/12.2266517
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 102242X (30 December 2016); doi: 10.1117/12.2267190
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 102242Y (30 December 2016); doi: 10.1117/12.2264516
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 102242Z (30 December 2016); doi: 10.1117/12.2267131
Back to Top