30 December 2016 A simple calculation method for heavy ion induced soft error rate in space environment
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Proceedings Volume 10224, International Conference on Micro- and Nano-Electronics 2016; 1022414 (2016) https://doi.org/10.1117/12.2267145
Event: The International Conference on Micro- and Nano-Electronics 2016, 2016, Zvenigorod, Russian Federation
Abstract
In this paper based on the new parameterization shape, an alternative heavy ion induced soft errors characterization approach is proposed and validated. The method provides an unambiguous calculation procedure to predict an upset rate in highly-scaled memory in a space environment.
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A. M. Galimov, A. M. Galimov, I. V. Elushov, I. V. Elushov, G. I. Zebrev, G. I. Zebrev, } "A simple calculation method for heavy ion induced soft error rate in space environment", Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 1022414 (30 December 2016); doi: 10.1117/12.2267145; https://doi.org/10.1117/12.2267145
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