30 December 2016 Fundamentals of the fast neutral beams diagnostics
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Proceedings Volume 10224, International Conference on Micro- and Nano-Electronics 2016; 102242C (2016) https://doi.org/10.1117/12.2266889
Event: The International Conference on Micro- and Nano-Electronics 2016, 2016, Zvenigorod, Russian Federation
Abstract
Physical principles of fast neutral beams diagnostics methods are considered. In the opening sections an analysis of the methods intended for measurement of beam composition and energy characteristics of the beam components is presented. For the high resolution Doppler spectroscopy method some relations for energy resolution are derived. For the ionization method an approach to the atomic content calculations is developed in cases of a working gas like H2, N2, O2. Further on, the secondary electron emission, calorimetric, and quartz resonator probes are considered. Dependences of the probe responses on the beam parameters are presented. The results obtained can be used for development and design of fast neutral beams diagnostics systems.
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V. Kudrya, V. Kudrya, Yu. Maishev, Yu. Maishev, } "Fundamentals of the fast neutral beams diagnostics", Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 102242C (30 December 2016); doi: 10.1117/12.2266889; https://doi.org/10.1117/12.2266889
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