30 December 2016 Stark-shift based quantum dot-cavity electrometer
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Proceedings Volume 10224, International Conference on Micro- and Nano-Electronics 2016; 102242I (2016) https://doi.org/10.1117/12.2267133
Event: The International Conference on Micro- and Nano-Electronics 2016, 2016, Zvenigorod, Russian Federation
In this paper we propose the scheme of an optical quantum sensor of external electric field which design based on a double quantum dot (DQD) placed in a high quality optical semiconductor microcavity (MC). The characteristic DQD frequencies of the observed nontrivial single-electron dynamics are determined using spectroscopic simulation in the steady-state regime. Due to Stark shifts of excited energy levels of DQD located at the edge of microdisk the hybrid electron-photon spectrum changes depending on the strength and direction of electric field. Probe laser with tunable wavelength excites the structure in single-photon regime and photon spectrum from MC is detected. We analyze the system’s behavior with the use of a standard technique based on solving the Lindblad equation for the density matrix of an electron-phonon system with regard to the escape of photons from the cavity to the continuum and the relaxation of an excited electron with the emission of a photon or phonon. It will be shown that due to the design features, such a device has several advantages: high sensitivity, availability of different channels for excitation and measuring, the ability to accurately detect the spatial distribution of the field.
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Alexander V. Tsukanov, Alexander V. Tsukanov, Vadim G. Chekmachev, Vadim G. Chekmachev, } "Stark-shift based quantum dot-cavity electrometer", Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 102242I (30 December 2016); doi: 10.1117/12.2267133; https://doi.org/10.1117/12.2267133

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