31 May 2017 A table top polarimetric facility for the EUV spectral range: implementations and characterization
Author Affiliations +
Abstract
The EUV reflectometer facility available at the Institute for Photonics and Nanotechnologies-CNR Padua (Italy) has been characterized in terms of Stokes’ parameters at two wavelengths of particular interest for space applications, the hydrogen Lyman alpha at 121.6 nm and 160 nm. The design and the performances of a polarizer based on four gold coated mirrors and coupled with the facility are also described. The whole system consisting of the reflectometer and the polarizer can be used to test mirrors, polarizers and phase retarders in the EUV range by means of the Mueller Matrix formalism, and even to investigate compositions, interfaces and structure of thin films and optical coatings.
© (2017) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
A. E. H. Gaballah, P. Zuppella, Nadeem Ahmed, K. Jimenez, G. Pettinari, A. Gerardino, P. Nicolosi, "A table top polarimetric facility for the EUV spectral range: implementations and characterization ", Proc. SPIE 10235, EUV and X-ray Optics: Synergy between Laboratory and Space V, 102350X (31 May 2017); doi: 10.1117/12.2265592; https://doi.org/10.1117/12.2265592
PROCEEDINGS
10 PAGES


SHARE
RELATED CONTENT

An all-reflective polarization rotator
Proceedings of SPIE (May 16 2017)
Polarizing optics for the soft x ray regime whispering...
Proceedings of SPIE (November 01 1991)
Monostatic Mueller matrix laser reflectometer
Proceedings of SPIE (August 18 2005)
Multilayer thin-film design as far-ultraviolet polarizers
Proceedings of SPIE (January 21 1993)

Back to Top