PROCEEDINGS VOLUME 10236
SPIE OPTICS + OPTOELECTRONICS | 24-27 APRIL 2017
Damage to VUV, EUV, and X-ray Optics VI
IN THIS VOLUME

9 Sessions, 9 papers, 9 videos
Proceedings Volume 10236 is from: Logo
SPIE OPTICS + OPTOELECTRONICS
24-27 April 2017
Prague, Czech Republic
Front Matter: Volume 10236
Proc. SPIE 10236, Front Matter: Volume 10236, 1023601(21 June 2017);doi: 10.1117/12.2281836
Damage to Optics I
Proc. SPIE 10236, A finite element approach to x-ray optics design, 1023605(15 May 2017);doi: 10.1117/12.2268072
Laser-Matter Interaction
Proc. SPIE 10236, Ultrafast breakdown of dielectrics: new insight from double pump-probe experiments (Conference Presentation), 1023607();doi: 10.1117/12.2265927
Damage to Samples
Proc. SPIE 10236, Investigating radiation induced damage processes with femtosecond x-ray pulses (Conference Presentation), 102360B();doi: 10.1117/12.2270685
Proc. SPIE 10236, Is there any dose-rate effect in breaking DNA strands by short pulses of extreme ultraviolet and soft x-ray radiation? (Conference Presentation), 102360C();doi: 10.1117/12.2271171
Damage to Optics II
Proc. SPIE 10236, Growth of nano-dots on the grazing incidence mirror surface under FEL irradiation: analytic approach to modeling, 102360D(15 May 2017);doi: 10.1117/12.2269371
Proc. SPIE 10236, Low-pressure RF remote plasma cleaning of carbon-contaminated B4C-coated optics, 102360E(15 May 2017);doi: 10.1117/12.2269374
Proc. SPIE 10236, Study of performance loss of Lyman alpha filters due to chemical contamination, 102360F(15 May 2017);doi: 10.1117/12.2265864
Theory of Damage
Proc. SPIE 10236, Classical Monte-Carlo simulations of x-ray induced electron cascades in various materials, 102360H(15 May 2017);doi: 10.1117/12.2267939
Proc. SPIE 10236, Influence of model parameters on a simulation of x-ray irradiated materials: example of XTANT code, 102360I(15 May 2017);doi: 10.1117/12.2266953
Poster Session
Proc. SPIE 10236, Formation of periodic relief at Sc/Si multilayer surface under EUV laser irradiation, 102360J(15 May 2017);doi: 10.1117/12.2267292
Proc. SPIE 10236, Optical and structural characterization of Nb, Zr, Nb/Zr, Zr/Nb thin films on Si3N4 membranes windows, 102360K(15 May 2017);doi: 10.1117/12.2267348
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