This PDF file contains the front matter associated with SPIE Proceedings Volume 10237, including the Title Page, Copyright information, Table of Contents, and Conference Committee listing.

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Author(s), “Title of Paper,” in Advances in X-ray Free-Electron Lasers Instrumentation IV, edited by

Thomas Tschentscher, Luc Patthey, Proceedings of SPIE Vol. 10237 (SPIE, Bellingham, WA, 2017)

Seven-digit Article CID Number.ISSN: 0277-786X

ISSN: 1996-756X (electronic)

ISBN: 9781510609754

ISBN: 9781510609761 (electronic)

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Numbers in the index correspond to the last two digits of the seven-digit citation identifier (CID) article numbering system used in Proceedings of SPIE. The first five digits reflect the volume number. Base 36 numbering is employed for the last two digits and indicates the order of articles within the volume. Numbers start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B…0Z, followed by 10-1Z, 20-2Z, etc.

Allaria, E., 0F

Alonso-Mori, Roberto, 0M

Andreev, A. A., 0S

Appel, Karen, 0S, 13

Barada, Andrew H., 0R

Bencivenga, Filippo, 0C

Berujon, Sebastien, 0K

Bonora, Stefano, 0T

Branco, J., 0S

Braun, Stefan, 13

Brenner, Günter, 16

Briggs, R., 0S

Browne, Michael C., 0W

Bussmann, M., 0S

Buzmakov, A., 0S

Calvi, Andrea, 0C

Capotondi, Flavio, 0C

Carini, Gabriella, 0W

Chollet, Matthieu, 0M

Cojocaru, Ruxandra, 0K

Cucini, Riccardo, 0C

Damiani, Daniel S., 0M

Decker, Franz-Josef, 0N

DePonte, Daniel P., 0W

Fabris, Nicola, 0T

Feng, Yiping, 0H, 0M, 14

Foglia, Laura, 0C

Fortmann-Grote, C., 0S

Frassetto, Fabio, 0T, 16

Freijo-Martin, I., 0O

Fuoss, Paul H., 0N

Galtier, Eric C., 0W

Garten, M., 0S

Gawlitza, Peter, 13

Giovine, Ennio, 0T

Glownia, James M., 0M

Grübel, Gerhard, 0N

Grund, A., 0S

Gumerlock, Karl L., 0R

Hart, Philip A., 0W

Hastings, Jerome B., 0M

Hruszkewycz, Stephan, 0N

Huang, Zhirong, 0H

Huebl, A., 0S

Inoue, Ichiro, 06

Inubushi, Yuichi, 06

James, Justin H., 0R

Jurek, Z., 0S

Kärcher, Victor, 13

Katayama, Tetsuo, 06

Kiskinova, Maya, 0C

Kon, Akira, 06

Koralek, J. D., 0W

Koyama, Takahisa, 06

Krzywinski, Jacek, 0H

Kuhlmann, Marion, 10, 12, 16

Li, Peng, 0J, 0Z

Li, Yuhui, 0J, 0Z

Loh, N. D., 0S

Ludwig, Karl, 0N

Lutman, Alberto, 0H

Mahne, Nicola, 0C

Mancuso, A. P., 0S

Manfredda, Michele, 0C

Martin, Thierry, 0K

Masciovecchio, Claudio, 0C

Mincigrucci, Riccardo, 0C

Miotti, Paolo, 0T

Mitra, Ankush, 0W

Nakahara, Kazutaka, 0W

Nakatsutsumi, M., 0S

Nelson, Silke, 0M

Nicolas, Josep, 0R

Nölle, D., 08

Ohashi, Haruhiko, 06

Osaka, Taito, 06

Osier, Ted O., 0R

Owada, Shigeki, 06

Pedersoli, Emanuele, 0C

Pflueger, Joachim, 0J, 0Z

Plönjes, Elke, 12, 16

Poletto, Luca, 0T, 16

Principi, Emiliano, 0C

Quintavalla, Martino, 0T

Raimondi, Lorenzo, 0C

Raubenheimer, Tor O., 14

Robert, Aymeric, 0M, 0N, 0R

Roling, Sebastian, 12, 13

Rollnik, Matthias, 12, 13

Roseker, Wojciech, 0N

Samoylova, Liubov, 0S, 13

Santra, R., 0S

Schafer, Donald W., 0R

Schneidmiller, E. A., 0G, 0I, 0S, 10, 11

Sharma, A., 0S

Shi, Hongliang, 0R

Siewert, Frank, 13

Simoncig, Alberto, 0C

Smith, Brian, 0R

Song, Sanghoon, 0M, 0N

Steiniger, K., 0S

Stephenson, G. Brian, 0N

Sun, Yanwen, 0N, 0R

Sutton, Mark, 0N

Togashi, Tadashi, 06

Tono, Kensuke, 06

Vannoni, M., 0O

Wahlert, Frank, 12, 13

Wei, Tao, 0J, 0Z

Weninger, Clemens, 0M

Whitney, Randy, 0R

Wu, Juhao, 0H

Yabashi, Makina, 06

Yabuuchi, Toshinori, 06

Yakubov, S., 0S

Yoon, C. H., 0S

Yumoto, Hirokatsu, 06

Yurkov, M. V., 0G, 0I, 0S, 10, 11

Zacharias, Helmut, 12, 13

Zangrando, Marco, 0C

Zastrau, Ulf, 0S, 13

Zhang, Lin, 0R

Zhu, Diling, 0H, 0M, 0N, 0R

Ziaja-Motyka, B., 0S

Ziegler, Eric, 0K

Conference Committee

Symposium Chairs

  • Jiri Homola, Institute of Photonics and Electronics of the ASCR, v.v.i. (Czech Republic)

  • Bedrich Rus, Institute of Physics of the ASCR, v.v.i. (Czech Republic)

  • Chris Edwards, Central Laser Facility, Science and Technology Facilities Council (United Kingdom)

  • Mike Dunne, SLAC National Accelerator Laboratory (United States) and Linac Coherent Light Source (United States)

  • Ivo Rendina, Istituto per la Microelettronica e Microsistemi, CNR (Italy)

Conference Chairs

  • Thomas Tschentscher, European XFEL GmbH (Germany)

  • Luc Patthey, Paul Scherrer Institut (Switzerland)

Conference Programme Committee

  • Sven Reiche, Paul Scherrer Institut (Switzerland)

  • Aymeric Robert, SLAC National Accelerator Laboratory (United States)

  • Rolf Treusch, Deutsches Elektronen-Synchrotron (Germany)

  • Makina Yabashi, Japan Synchrotron Radiation Research Institute (JASRI) (Japan)

  • Mikhail V. Yurkov, Deutsches Elektronen-Synchrotron (Germany)

  • Marco Zangrando, Elettra-Sincrotrone Trieste S.C.p.A. (Italy)

  • Philippe Zeitoun, Laboratoire d'Optique Appliquée (France)

Session Chairs

  • Scientific Applications of Laser- and Accelerator-based X-ray

    Sources: Joint Session with Conferences 10237 and 10243

    Thomas Tschentscher, European XFEL GmbH (Germany)

  • Temporal, Spatial and Coherence Diagnostics of Ultrashort X-ray

    Pulses: Joint Session with Conferences 10237 and 10243

    Carmen S. Menoni, Colorado State University (United States)

  • Status and Development Plans of Planned and Operational VUV, EUV, Soft X-ray and X-ray FEL Facilities

    Rolf Treusch, Deutsches Elektronen-Synchrotron (Germany)

  • High Brightness and Ultrashort X-ray and EUV Sources: Joint Session with Conferences 10237 and 10243

    Annie Klisnick, Université Paris-Sud 11 (France)

  • FEL Schemes and Characterization of Electron Beam and FEL


    Luc Patthey, Paul Scherrer Institut (Switzerland)

  • Characterization of FEL Radiation

    Mikhail V. Yurkov, Deutsches Elektronen-Synchrotron (Germany)

  • X-ray Optics and Beam Transport Issues Including Propagation of

    Coherent X-ray FEL Radiation and Simulation of X-ray FEL I

    Luc Patthey, Paul Scherrer Institut (Switzerland)

  • X-ray Optics and Beam Transport Issues Including Propagation of

    Coherent X-ray FEL Radiation and Simulation of X-ray FEL II

    Luc Patthey, Paul Scherrer Institut (Switzerland)

  • Advanced Instrumentation for FEL Experiments in the Areas of Special

    X-ray Techniques, Sample Environment, Detectors and Lasers

    Thomas Tschentscher, European XFEL GmbH (Germany)


Free-electron laser (FEL) user facilities for the short-wavelength regime from vacuum-ultraviolet to hard x-rays are operational for more than a decade now. In Europe FLASH (Hamburg) and FERMI (Trieste), world-wide LCLS (Menlo Park, U.S.A.), SACLA (Harima, Japan) and PAL-XFEL (Pohang, South Corea; from 2017) are the facilities to be listed here. In Europe, two new facilities with presently nine end-stations for experiments turn on in the current year: SwissFEL (Villigen) and European XFEL (Hamburg). X-ray FEL radiation provides exquisite beam properties in terms of pulse duration, coherence, and pulse energy. High repetition rate facilities like FLASH and European XFEL also provide high average flux. Shortwavelength FELs combine features of conventional x-ray sources and of ultrashort and highly intense optical laser sources. At the same time the FEL sources are highly complementary to these x-ray sources, like e.g. provided by synchrotron radiation from storage rings, and optical laser sources.

In the past decade x-ray FEL radiation has already been applied to a large number of high profile scientific applications reaching from physics, over chemistry, material and earth sciences to biology. Many of these applications were enabled by employing state-of-the-art developments of the FEL sources and their properties, of new x-ray and optical laser techniques, and of new instrumentation developed for and at the FEL facilities. Vice-versa, science applications generated additional and new requirements for the further development of the FEL sources, x-ray techniques and their instrumentation. This very dynamic field of development of FEL sources and instrumentation for x-ray FEL experiments has led to a large number of new results in many different areas since this conference was held last, two years ago.

The conference therefore has a specific focus on these new developments and on scientific applications requiring these developments. The conference itself and the papers in this proceeding volume address new and outstanding scientific applications of x-ray FELs, the start of new FEL facilities and the further development of existing ones, the development of new FEL and similar radiation schemes, the progress with high quality x-ray optics designed for general and specific applications, the development and implementation of x-ray diagnostics methods, and the further development and the implementation of ancillary instrumentation like detectors and laser systems, which are so important for the success of experiments using these large scale user facilities. Specific topics are the current developments in the areas of special FEL schemes and the major development activities with respect to providing high average brightness and ultrahigh peak brightness.

In 2017 part of this conference was organized jointly with the conference on “XRay Lasers and Coherent X-Ray Sources: Development and Applications” [1]. Joint sessions were held on the topics “high brightness and ultrashort x-ray and EUV sources”, “scientific applications of laser- and accelerator-based x-ray sources” and “temporal, spatial and coherence diagnostics of ultrashort x-ray pulses”. These areas represent a highly common interest, both in terms of method developments and scientific application.

Thomas Tschentscher

Luc Patthey



A. Klisnick, C. Menoni (eds.), X-Ray Lasers and Coherent X-Ray Sources: Development and Applications, Proceedings of SPIE 10243, Prague, 24. – 27. April 2017Google Scholar

© (2017) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
} "Front Matter: Volume 10237", Proc. SPIE 10237, Advances in X-ray Free-Electron Lasers Instrumentation IV, 1023701 (3 July 2017); doi: 10.1117/12.2281162; https://doi.org/10.1117/12.2281162

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