The papers included in this volume were part of the technical conference cited on the cover and title page. Papers were selected and subject to review by the editors and conference program committee. Some conference presentations may not be available for publication. The papers published in these proceedings reflect the work and thoughts of the authors and are published herein as submitted. The publisher is not responsible for the validity of the information or for any outcomes resulting from reliance thereon.

Please use the following format to cite material from these proceedings:

Author(s), “Title of Paper,” in Advances in X-ray Free-Electron Lasers Instrumentation IV, edited by

Thomas Tschentscher, Luc Patthey, Proceedings of SPIE Vol. 10237 (SPIE, Bellingham, WA, 2017)

Seven-digit Article CID Number.ISSN: 0277-786X

ISSN: 1996-756X (electronic)

ISBN: 9781510609754

ISBN: 9781510609761 (electronic)

Published by SPIE

P.O. Box 10, Bellingham, Washington 98227-0010 USA

Telephone +1 360 676 3290 (Pacific Time)· Fax +1 360 647 1445

SPIE.org

Copyright © 2017, Society of Photo-Optical Instrumentation Engineers.

Copying of material in this book for internal or personal use, or for the internal or personal use of specific clients, beyond the fair use provisions granted by the U.S. Copyright Law is authorized by SPIE subject to payment of copying fees. The Transactional Reporting Service base fee for this volume is $18.00 per article (or portion thereof), which should be paid directly to the Copyright Clearance Center (CCC), 222 Rosewood Drive, Danvers, MA 01923. Payment may also be made electronically through CCC Online at copyright.com. Other copying for republication, resale, advertising or promotion, or any form of systematic or multiple reproduction of any material in this book is prohibited except with permission in writing from the publisher. The CCC fee code is 0277-786X/17/$18.00.

Printed in the United States of America.

Publication of record for individual papers is online in the SPIE Digital Library.

Paper Numbering: Proceedings of SPIE follow an e-First publication model, with papers published first online and then in print. Papers are published as they are submitted and meet publication criteria. A unique citation identifier (CID) number is assigned to each article at the time of the first publication. Utilization of CIDs allows articles to be fully citable as soon as they are published online, and connects the same identifier to all online, print, and electronic versions of the publication. SPIE uses a seven-digit CID article numbering system in which:

Authors

Numbers in the index correspond to the last two digits of the seven-digit citation identifier (CID) article numbering system used in Proceedings of SPIE. The first five digits reflect the volume number. Base 36 numbering is employed for the last two digits and indicates the order of articles within the volume. Numbers start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B…0Z, followed by 10-1Z, 20-2Z, etc.

Allaria, E., 0F

Alonso-Mori, Roberto, 0M

Andreev, A. A., 0S

Appel, Karen, 0S, 13

Barada, Andrew H., 0R

Bencivenga, Filippo, 0C

Berujon, Sebastien, 0K

Bonora, Stefano, 0T

Branco, J., 0S

Braun, Stefan, 13

Brenner, Günter, 16

Briggs, R., 0S

Browne, Michael C., 0W

Bussmann, M., 0S

Buzmakov, A., 0S

Calvi, Andrea, 0C

Capotondi, Flavio, 0C

Carini, Gabriella, 0W

Chollet, Matthieu, 0M

Cojocaru, Ruxandra, 0K

Cucini, Riccardo, 0C

Damiani, Daniel S., 0M

Decker, Franz-Josef, 0N

DePonte, Daniel P., 0W

Fabris, Nicola, 0T

Feng, Yiping, 0H, 0M, 14

Foglia, Laura, 0C

Fortmann-Grote, C., 0S

Frassetto, Fabio, 0T, 16

Freijo-Martin, I., 0O

Fuoss, Paul H., 0N

Galtier, Eric C., 0W

Garten, M., 0S

Gawlitza, Peter, 13

Giovine, Ennio, 0T

Glownia, James M., 0M

Grübel, Gerhard, 0N

Grund, A., 0S

Gumerlock, Karl L., 0R

Hart, Philip A., 0W

Hastings, Jerome B., 0M

Hruszkewycz, Stephan, 0N

Huang, Zhirong, 0H

Huebl, A., 0S

Inoue, Ichiro, 06

Inubushi, Yuichi, 06

James, Justin H., 0R

Jurek, Z., 0S

Kärcher, Victor, 13

Katayama, Tetsuo, 06

Kiskinova, Maya, 0C

Kon, Akira, 06

Koralek, J. D., 0W

Koyama, Takahisa, 06

Krzywinski, Jacek, 0H

Kuhlmann, Marion, 10, 12, 16

Li, Peng, 0J, 0Z

Li, Yuhui, 0J, 0Z

Loh, N. D., 0S

Ludwig, Karl, 0N

Lutman, Alberto, 0H

Mahne, Nicola, 0C

Mancuso, A. P., 0S

Manfredda, Michele, 0C

Martin, Thierry, 0K

Masciovecchio, Claudio, 0C

Mincigrucci, Riccardo, 0C

Miotti, Paolo, 0T

Mitra, Ankush, 0W

Nakahara, Kazutaka, 0W

Nakatsutsumi, M., 0S

Nelson, Silke, 0M

Nicolas, Josep, 0R

Nölle, D., 08

Ohashi, Haruhiko, 06

Osaka, Taito, 06

Osier, Ted O., 0R

Owada, Shigeki, 06

Pedersoli, Emanuele, 0C

Pflueger, Joachim, 0J, 0Z

Plönjes, Elke, 12, 16

Poletto, Luca, 0T, 16

Principi, Emiliano, 0C

Quintavalla, Martino, 0T

Raimondi, Lorenzo, 0C

Raubenheimer, Tor O., 14

Robert, Aymeric, 0M, 0N, 0R

Roling, Sebastian, 12, 13

Rollnik, Matthias, 12, 13

Roseker, Wojciech, 0N

Samoylova, Liubov, 0S, 13

Santra, R., 0S

Schafer, Donald W., 0R

Schneidmiller, E. A., 0G, 0I, 0S, 10, 11

Sharma, A., 0S

Shi, Hongliang, 0R

Siewert, Frank, 13

Simoncig, Alberto, 0C

Smith, Brian, 0R

Song, Sanghoon, 0M, 0N

Steiniger, K., 0S

Stephenson, G. Brian, 0N

Sun, Yanwen, 0N, 0R

Sutton, Mark, 0N

Togashi, Tadashi, 06

Tono, Kensuke, 06

Vannoni, M., 0O

Wahlert, Frank, 12, 13

Wei, Tao, 0J, 0Z

Weninger, Clemens, 0M

Whitney, Randy, 0R

Wu, Juhao, 0H

Yabashi, Makina, 06

Yabuuchi, Toshinori, 06

Yakubov, S., 0S

Yoon, C. H., 0S

Yumoto, Hirokatsu, 06

Yurkov, M. V., 0G, 0I, 0S, 10, 11

Zacharias, Helmut, 12, 13

Zangrando, Marco, 0C

Zastrau, Ulf, 0S, 13

Zhang, Lin, 0R

Zhu, Diling, 0H, 0M, 0N, 0R

Ziaja-Motyka, B., 0S

Ziegler, Eric, 0K

Conference Committee

Symposium Chairs

Conference Chairs

Conference Programme Committee

Session Chairs

Introduction

Free-electron laser (FEL) user facilities for the short-wavelength regime from vacuum-ultraviolet to hard x-rays are operational for more than a decade now. In Europe FLASH (Hamburg) and FERMI (Trieste), world-wide LCLS (Menlo Park, U.S.A.), SACLA (Harima, Japan) and PAL-XFEL (Pohang, South Corea; from 2017) are the facilities to be listed here. In Europe, two new facilities with presently nine end-stations for experiments turn on in the current year: SwissFEL (Villigen) and European XFEL (Hamburg). X-ray FEL radiation provides exquisite beam properties in terms of pulse duration, coherence, and pulse energy. High repetition rate facilities like FLASH and European XFEL also provide high average flux. Shortwavelength FELs combine features of conventional x-ray sources and of ultrashort and highly intense optical laser sources. At the same time the FEL sources are highly complementary to these x-ray sources, like e.g. provided by synchrotron radiation from storage rings, and optical laser sources.

In the past decade x-ray FEL radiation has already been applied to a large number of high profile scientific applications reaching from physics, over chemistry, material and earth sciences to biology. Many of these applications were enabled by employing state-of-the-art developments of the FEL sources and their properties, of new x-ray and optical laser techniques, and of new instrumentation developed for and at the FEL facilities. Vice-versa, science applications generated additional and new requirements for the further development of the FEL sources, x-ray techniques and their instrumentation. This very dynamic field of development of FEL sources and instrumentation for x-ray FEL experiments has led to a large number of new results in many different areas since this conference was held last, two years ago.

The conference therefore has a specific focus on these new developments and on scientific applications requiring these developments. The conference itself and the papers in this proceeding volume address new and outstanding scientific applications of x-ray FELs, the start of new FEL facilities and the further development of existing ones, the development of new FEL and similar radiation schemes, the progress with high quality x-ray optics designed for general and specific applications, the development and implementation of x-ray diagnostics methods, and the further development and the implementation of ancillary instrumentation like detectors and laser systems, which are so important for the success of experiments using these large scale user facilities. Specific topics are the current developments in the areas of special FEL schemes and the major development activities with respect to providing high average brightness and ultrahigh peak brightness.

In 2017 part of this conference was organized jointly with the conference on “XRay Lasers and Coherent X-Ray Sources: Development and Applications” [1]. Joint sessions were held on the topics “high brightness and ultrashort x-ray and EUV sources”, “scientific applications of laser- and accelerator-based x-ray sources” and “temporal, spatial and coherence diagnostics of ultrashort x-ray pulses”. These areas represent a highly common interest, both in terms of method developments and scientific application.

Thomas Tschentscher

Luc Patthey