14 June 2017 Single-shot beam profile diagnostics for x-ray FEL's using gas fluorescence
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Abstract
We report experimental demonstration of capturing single-shot X-ray Free-electron Laser (FEL) beam profiles using gas fluorescence. The measurement was carried out at the Linac Coherent Light Source using 7 keV hard X-rays propagating through ambient air. The nitrogen fluorescence emitted upon the passage of the X-ray FEL beam were imaged using a highly sensitive optical setup, and there was sufficient optical yield that single-shot measurements were feasible. By taking two orthogonal and simultaneous images, the beam trajectory could be determined in a nearly non-invasive manner, and is best suited for photon energies in the soft X-ray regime, where such a diagnostic capability has been largely unavailable previously. The integrated intensity of the images could also serve as a non-invasive intensity monitor, complementary to current implementations of gas- and solidbased monitors. High repetition-rate Free-electron Lasers can greatly benefit from such a new diagnostic tool for eliminating potential thermal damages.
Conference Presentation
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Yiping Feng, Yiping Feng, Diling Zhu, Diling Zhu, Clemens Weninger, Clemens Weninger, Roberto Alonso-Mori, Roberto Alonso-Mori, Matthieu Chollet, Matthieu Chollet, Daniel S. Damiani, Daniel S. Damiani, James M. Glownia, James M. Glownia, Jerome B. Hastings, Jerome B. Hastings, Silke Nelson, Silke Nelson, Sanghoon Song, Sanghoon Song, Aymeric Robert, Aymeric Robert, } "Single-shot beam profile diagnostics for x-ray FEL's using gas fluorescence", Proc. SPIE 10237, Advances in X-ray Free-Electron Lasers Instrumentation IV, 102370M (14 June 2017); doi: 10.1117/12.2268862; https://doi.org/10.1117/12.2268862
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