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28 March 1989 Intensity Profiling The Ultraviolet Laser Beam
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Proceedings Volume 1024, Beam Diagnostics and Beam Handling Systems; (1989)
Event: 1988 International Congress on Optical Science and Engineering, 1988, Hamburg, Germany
Many applications of ultraviolet (UV) lasers would be greatly facilitated if the designers and users of associated optical systems could characterize the beams as to location, size, shape and intensity distribution at selected points along the optical path. We describe a new technique based upon visible light fluorescence induced into a crystalline plate when irradiated by a UV beam as a means for performing these measurements. Instruments applying this principle and allowing the user to observe the otherwise invisible beam as well as to quantify its intensity profiles using electronic and/or computer analysis methods also are described.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Paul R. Yoder Jr., William B. Telfair, Clifford A. Martin, and Peter S Bennett "Intensity Profiling The Ultraviolet Laser Beam", Proc. SPIE 1024, Beam Diagnostics and Beam Handling Systems, (28 March 1989);

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