Presentation + Paper
16 June 2017 Soft x-ray ablation mass spectrometry: high sensitivity elemental trace analysis
Author Affiliations +
Abstract
We have previously shown soft x-ray laser ablation time-of-flight mass spectrometry has the ability to detect singly ionized alanine molecules arising from the single shot ablation of a ∼50 zeptoliter volume. This superior sensitivity results from the ability to focus the 46.9 nm wavelength (26.4 eV energy per photon) laser beam to the diffraction limit, the strong absorption, and the efficient photoionization of the soft x-ray photons. In this paper we describe results on the application of soft x-ray laser mass spectrometry to elemental trace analysis in inorganic materials. Two dimensional imaging with spatial resolution of 80 nm in inorganic samples is also demonstrated.
Conference Presentation
© (2017) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
I. Kuznetsov, T. Green, W. Chao, A. M. Duffin, J. J. Rocca, and C. S. Menoni "Soft x-ray ablation mass spectrometry: high sensitivity elemental trace analysis", Proc. SPIE 10243, X-ray Lasers and Coherent X-ray Sources: Development and Applications, 102430G (16 June 2017); https://doi.org/10.1117/12.2267159
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KEYWORDS
Ions

Laser ablation

Oxides

Zone plates

Mass spectrometry

Scandium

Argon

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