17 May 2017 Evaluation of laser-electron x-ray source and related optics for x-ray diffractometry and topography
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Abstract
A new type of a high-brilliance X-ray source known as the Thomson X-ray laser-electron generator (TXG) opens new possibilities for materials characterization by X-ray diffraction methods such as high resolution X-ray diffractometry and topography and diffraction analysis at extreme conditions in shear diamond anvil cells. The advantages of the TXG compared to X-ray laboratory sources are a high flux, a quasi-monochromatic, nearly parallel beam and a tunable wavelength. The paper presents examples of applications as well as estimations of typical photon flux and exposure time saving advantages resulted from an implementation of TXG radiation in a home laboratory.
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S. N. Polyakov, S. N. Polyakov, I. A. Artyukov, I. A. Artyukov, V. D. Blank, V. D. Blank, S. I. Zholudev, S. I. Zholudev, R. M. Feshchenko, R. M. Feshchenko, N. L. Popov, N. L. Popov, A. A. Yaroslavtsev, A. A. Yaroslavtsev, A. V. Vinogradov, A. V. Vinogradov, } "Evaluation of laser-electron x-ray source and related optics for x-ray diffractometry and topography", Proc. SPIE 10243, X-ray Lasers and Coherent X-ray Sources: Development and Applications, 102430Y (17 May 2017); doi: 10.1117/12.2264976; https://doi.org/10.1117/12.2264976
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