5 January 2017 Experiment research of the temperature characteristics of transmissive silica waveguide ring resonator
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Proceedings Volume 10244, International Conference on Optoelectronics and Microelectronics Technology and Application; 1024411 (2017) https://doi.org/10.1117/12.2264537
Event: International Conference on Optoelectronics and Microelectronics Technology and Application, 2016, Shanghai, China
Abstract
The temperature-dependent polarization error occurred in the silica waveguide ring resonator (WRR) is a major factor that limits the long-term performance of resonator integrated optic gyro (RIOG). In this paper, the temperature characteristics of transmissive silica WRR are successfully measured using the experiment system and analyzed in detail by us. According to the experiment results, we accurately calculate the temperature-induced refractive index and birefringence variation coefficient of silica waveguide, and we have found that the interference dip and peak of resonance curves will appear alternatively in the period of temperature fluctuation, which had not be shown before.
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Huilan Liu, Huilan Liu, Jupeng Yang, Jupeng Yang, Lishuang Feng, Lishuang Feng, Qiwei Wang, Qiwei Wang, } "Experiment research of the temperature characteristics of transmissive silica waveguide ring resonator", Proc. SPIE 10244, International Conference on Optoelectronics and Microelectronics Technology and Application, 1024411 (5 January 2017); doi: 10.1117/12.2264537; https://doi.org/10.1117/12.2264537
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