The paper demonstrated how to design circuit to test these parameters and obtain their variations trajectory in accelerated degradation test. In this paper, 20 VO2630 devices were divided into four groups, and a accelerated test at 100°C, 125°C, 150°C and 175°C was conducted to monitor propagation delay time and other parameters related with low-frequency noise. These parameters had different degrees of degradation. This paper showed the degradation process of propagation delay time. It was found that the initial value of propagation delay time was nearly identical, but parameters related with low-frequency noise had different initial values. The larger the initial value of low frequency noise is, the faster propagation delay time will degrade. The main cause of degradation of propagation delay time is Schottky clamped transistor degradation. Finally, this paper discussed the advantages and disadvantages about utilizing conventional electrical parameters or low frequency noise to evaluate the reliability.
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Jiaoying Huang, Sicong Hu, Xiangfen Wang, Linjiang Hu, "Study on degradation of propagation delay time and low-frequency noise of high-speed optocoupler," Proc. SPIE 10250, International Conference on Optical and Photonics Engineering (icOPEN 2016), 102500G (10 February 2017);