8 March 2017 Refractive index inversion based on Mueller matrix method
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Proceedings Volume 10255, Selected Papers of the Chinese Society for Optical Engineering Conferences held October and November 2016; 102553N (2017) https://doi.org/10.1117/12.2267696
Event: Selected Papers of the Chinese Society for Optical Engineering Conferences held October and November 2016, 2016, Jinhua, Suzhou, Chengdu, Xi'an, Wuxi, China
Abstract
Based on Stokes vector and Jones vector, the correlation between Mueller matrix elements and refractive index was studied with the result simplified, and through Mueller matrix way, the expression of refractive index inversion was deduced. The Mueller matrix elements, under different incident angle, are simulated through the expression of specular reflection so as to analyze the influence of the angle of incidence and refractive index on it, which is verified through the measure of the Mueller matrix elements of polished metal surface. Research shows that, under the condition of specular reflection, the result of Mueller matrix inversion is consistent with the experiment and can be used as an index of refraction of inversion method, and it provides a new way for target detection and recognition technology.
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Huaxi Fan, Huaxi Fan, Wenyuan Wu, Wenyuan Wu, Yanhua Huang, Yanhua Huang, Zhaozhao Li, Zhaozhao Li, } "Refractive index inversion based on Mueller matrix method", Proc. SPIE 10255, Selected Papers of the Chinese Society for Optical Engineering Conferences held October and November 2016, 102553N (8 March 2017); doi: 10.1117/12.2267696; https://doi.org/10.1117/12.2267696
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