28 February 2017 Study of femtosecond laser spectrally resolved interferometry distance measurement based on excess fraction method
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Proceedings Volume 10256, Second International Conference on Photonics and Optical Engineering; 102565S (2017) https://doi.org/10.1117/12.2255828
Event: Second International Conference on Photonics and Optical Engineering, 2016, Xi'an, China
Abstract
Spectrally resolved interferometry (SRI) technology is a high precision laser interferometry technology, whose short non-ambiguity range (NAR) increases the precision requirement of pre-measurement in absolute distance measurement. In order to improve NAR of femtosecond laser SRI, the factors affecting NAR are studied in measurement system, and synthetic NAR method is presented based on excess fraction method to solve this question. A theoretical analysis is implemented and two Fabry-Perot Etalons with different free spectral range are selected to carry out digital simulation experiments. The experiment shows that NAR can be improved using synthetic NAR method and the precision is the same with that of fundamental femtosecond laser SRI.
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Rongyi Ji, Kun Hu, Yao Li, Shuyuan Gao, Weihu Zhou, "Study of femtosecond laser spectrally resolved interferometry distance measurement based on excess fraction method", Proc. SPIE 10256, Second International Conference on Photonics and Optical Engineering, 102565S (28 February 2017); doi: 10.1117/12.2255828; https://doi.org/10.1117/12.2255828
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