2 March 1989 An Accurate Method For Measuring The Spatial Resolution Of Integrated Image Sensors
Author Affiliations +
Proceedings Volume 1027, Image Processing II; (1989) https://doi.org/10.1117/12.950257
Event: 1988 International Congress on Optical Science and Engineering, 1988, Hamburg, Germany
Abstract
A reasonably simple and accurate method for measuring the spatial resolution of discrete photoelement image sensors was developed. It uses a scanning knife edge as an input pattern. This approach, which is based on rigourous theoretical considerations, gives quicker and more reliable results than the the usual bar pattern method. In addition, it can be fully automated.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
J. Glasser, J. Glasser, J. Vaillant, J. Vaillant, F. Chazallet, F. Chazallet, } "An Accurate Method For Measuring The Spatial Resolution Of Integrated Image Sensors", Proc. SPIE 1027, Image Processing II, (2 March 1989); doi: 10.1117/12.950257; https://doi.org/10.1117/12.950257
PROCEEDINGS
8 PAGES


SHARE
Back to Top