9 February 1989 Excentration Errors Combined With Wavefront Aberration In A Coherent Scanning Microscope
Author Affiliations +
Proceedings Volume 1028, Scanning Imaging; (1989) https://doi.org/10.1117/12.950309
Event: 1988 International Congress on Optical Science and Engineering, 1988, Hamburg, Germany
Abstract
The Coherent Scanning Microscope (CSM) is mainly composed of two objectives arranged in tandem combined with the scanned object. The synchronized scanning of both of the object and the electron beam emitted from the cathod ray monitor will assure the construction of the temporal image. Since it is easy to aligne the first objective of the CSM, while it is not the case for the second objective, hence we assume that the later objective is subjected to tilting and to a lateral shift with respect to the first aligned objective. Another case assumes that the second objective is influenced by coma of third order in addition to the exoentration errors. In both cases, the resulting impulse response hr= h1h2, is calculated. The above mentioned problems of excentration errors combined with wavefront aberration, which are both harmfull for the microscope resolution, are discussed.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
A. M. Hamed "Excentration Errors Combined With Wavefront Aberration In A Coherent Scanning Microscope", Proc. SPIE 1028, Scanning Imaging, (9 February 1989); doi: 10.1117/12.950309; https://doi.org/10.1117/12.950309
PROCEEDINGS
6 PAGES


SHARE
Advertisement
Advertisement
RELATED CONTENT

Microscopy using source and detector arrays
Proceedings of SPIE (March 08 2016)
Robust Bessel beam scanning without mechanical movement
Proceedings of SPIE (April 28 2016)
Parallel-mode confocal microscopy
Proceedings of SPIE (January 18 1999)
Ultrafast Laser Scanner Microscope-First Performance Tests
Proceedings of SPIE (October 31 1982)

Back to Top