28 March 1989 Overview Of Coherent Optics Applications In Metrology
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Proceedings Volume 1029, Scattering and Diffraction; (1989); doi: 10.1117/12.950417
Event: 1988 International Congress on Optical Science and Engineering, 1988, Hamburg, Germany
Abstract
If optical methods are long time ago used in metrology, coming of laser sources has improved drastically the impact of optics in metrology. The progressive existence of more and more industrial optoelectronic components on the market is responsible of the actual introduction of optical technics in industrial processings like interferometric control, wide-ranging optical sensors , visual inspection..... Further partial coherence and guiding properties of the light field, non linear optical comportment of the medium offer also interesting metrological applications. The aim of this paper is not to give a full description of all the optical methods used in metrology, but to draw some general specific properties and ideas illustrated by representative applications.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jean Ebbeni, "Overview Of Coherent Optics Applications In Metrology", Proc. SPIE 1029, Scattering and Diffraction, (28 March 1989); doi: 10.1117/12.950417; https://doi.org/10.1117/12.950417
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KEYWORDS
Metrology

Holograms

Diffraction

Scattering

Holography

Optical filters

Image filtering

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