PROCEEDINGS VOLUME 10291
OPTICAL SCIENCE, ENGINEERING AND INSTRUMENTATION '97 | 27 JULY - 1 AUGUST 1997
Materials Characterization and Optical Probe Techniques: A Critical Review
IN THIS VOLUME

1 Sessions, 23 Papers, 0 Presentations
OPTICAL SCIENCE, ENGINEERING AND INSTRUMENTATION '97
27 July - 1 August 1997
San Diego, CA, United States
Materials Characterization and Optical Probe Techniques
Proc. SPIE 10291, Front Matter: 10291, 1029101 (30 July 1997); doi: 10.1117/12.2284219
Proc. SPIE 10291, Mid- and near-infrared spectroscopy of polymers: time-resolved studies and remote sensing applications, 1029102 (30 July 1997); doi: 10.1117/12.279838
Proc. SPIE 10291, Four-wave mixing: applications to both fundamental research and photonics technology, 1029103 (30 July 1997); doi: 10.1117/12.279848
Proc. SPIE 10291, Characterization of polymers in solution with light scattering, 1029104 (30 July 1997); doi: 10.1117/12.279855
Proc. SPIE 10291, Moessbauer spectroscopy of iron containing polymers, 1029106 (30 July 1997); doi: 10.1117/12.279856
Proc. SPIE 10291, UV-vis spectroscopy as an analytical tool for the characterization of polymers, 1029107 (30 July 1997); doi: 10.1117/12.279857
Proc. SPIE 10291, Laser atomic fluorescence characterization of materials, 1029108 (30 July 1997); doi: 10.1117/12.279858
Proc. SPIE 10291, Dielectric spectroscopy as an analytical technique for the characterization of polymeric solids, 102910A (30 July 1997); doi: 10.1117/12.279859
Proc. SPIE 10291, SEM techniques for materials characterization, 102910B (30 July 1997); doi: 10.1117/12.279839
Proc. SPIE 10291, Review of transmission electron microscopy for the characterization of materials, 102910C (30 July 1997); doi: 10.1117/12.279840
Proc. SPIE 10291, Materials analysis using high-energy ion scattering, 102910D (30 July 1997); doi: 10.1117/12.279841
Proc. SPIE 10291, Characterization of optical materials using Auger electron spectroscopy, 102910E (30 July 1997); doi: 10.1117/12.279842
Proc. SPIE 10291, Surface analysis with scanning probe microscopy, 102910F (30 July 1997); doi: 10.1117/12.279843
Proc. SPIE 10291, Holographic characterization of optical materials, 102910G (30 July 1997); doi: 10.1117/12.279844
Proc. SPIE 10291, Photothermal sensing techniques for thin-film characterization, 102910H (30 July 1997); doi: 10.1117/12.279845
Proc. SPIE 10291, Core level spectroscopy for surface analysis, 102910J (30 July 1997); doi: 10.1117/12.279846
Proc. SPIE 10291, EPR and ENDOR characterization of nonlinear optical materials, 102910K (30 July 1997); doi: 10.1117/12.279847
Proc. SPIE 10291, Ellipsometry as a characterization technique, 102910L (30 July 1997); doi: 10.1117/12.279849
Proc. SPIE 10291, SIMS characterization of optical materials, 102910N (30 July 1997); doi: 10.1117/12.279850
Proc. SPIE 10291, Characterization of polymeric films by integrated optics, 102910O (30 July 1997); doi: 10.1117/12.279851
Proc. SPIE 10291, Electric-field-induced second harmonic generation, 102910P (30 July 1997); doi: 10.1117/12.279852
Proc. SPIE 10291, Z-scan technique for nonlinear materials characterization, 102910Q (30 July 1997); doi: 10.1117/12.279853
Proc. SPIE 10291, Characterization of polymers and particles with the analytical ultracentrifuge, 102910R (30 July 1997); doi: 10.1117/12.279854
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