Paper
19 July 1999 High-resolution imaging of heterogeneous surfaces with multifunctional NSOM
J. Kerimo, M. Buechler, William H. Smyrl
Author Affiliations +
Abstract
Imaging of surfaces and structures by NSOM has matured and is routinely used for studies ranging from biology to materials science. In the present paper, new developments will be emphasized that have resulted from the incorporation of a new technique for shear force feedback control of the scanning tip. The new technique involves the use of a quartz crystal tuning fork with the microscope, and this provides an open architecture for scanning tips. Thus not only is the normal optical contrast imaging done concurrently with topography imaging with optical fibers, but now one may substitute other tips such as nanoelectrodes for electrochemical imaging of reactive surfaces in concurrence with in-situ topography imaging. The modified instrument is now a multifunctional microscope that has many diverse applications.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
J. Kerimo, M. Buechler, and William H. Smyrl "High-resolution imaging of heterogeneous surfaces with multifunctional NSOM", Proc. SPIE 10294, Optical Metrology: A Critical Review, 102940F (19 July 1999); https://doi.org/10.1117/12.351663
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KEYWORDS
Near field scanning optical microscopy

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