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28 March 2001 Image processing for x-ray inspection of pistachio nuts
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Proceedings Volume 10301, Optics in Agriculture: 1990-2000: A Critical Review; 1030109 (2001)
Event: Environmental and Industrial Sensing, 2000, Boston, MA, United States
A review is provided of image processing techniques that have been applied to the inspection of pistachio nuts using X-ray images. X-ray sensors provide non-destructive internal product detail not available from other sensors. The primary concern in this data is detecting the presence of worm infestations in nuts, since they have been linked to the presence of aflatoxin. We describe new techniques for segmentation, feature selection, selection of product categories (clusters), classifier design, etc. Specific novel results include: a new segmentation algorithm to produce images of isolated product items; preferable classifier operation (the classifier with the best probability of correct recognition Pc is not best); higher-order discrimination information is present in standard features (thus, high-order features appear useful); classifiers that use new cluster categories of samples achieve improved performance. Results are presented for X-ray images of pistachio nuts; however, all techniques have use in other product inspection applications.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
David P. Casasent "Image processing for x-ray inspection of pistachio nuts", Proc. SPIE 10301, Optics in Agriculture: 1990-2000: A Critical Review, 1030109 (28 March 2001);

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