3 October 1993 Front Matter: Volume 10310
Proceedings Volume 10310, Technology of Proximal Probe Lithography; 1031001 (1993) https://doi.org/10.1117/12.2283725
Event: SPIE Institutes for Advanced Optical Technologies 10, 1993, Bellingham, WA, United States
Abstract
This PDF file contains the front matter associated with SPIE Proceedings Volume 10310, including the Title Page, Copyright information, Table of Contents, and Conference Committee listing.
Frontmatter-10310

List of Contributors

M. Aono

Aono Atomcraft Project

Exploratory Research for Advanced Technology

Japan Research Development Corp. Tokodai 5-9-9 Tsukuba, Ibaraki 300-26, Japan

Roger T. Brockenbrough

Univ.of Illnois Dept. of Electrical and Computer Engineering Urbana, IL 61801, USA

Francis G. Celii

Texas Instruments Inc. MS 147 P.O. Box 655936 Dallas, TX 75265-5936, USA

T. H. Chang

IBM T.J. Watson Research Ctr. Yorktown Heights, NY 10598, USA

John A. Dagata

National Institute of Standards and Technology Bldg. 220, Rm. A107 Gaithersburg, MD 20899-0001, USA

A. L. de Lozanne

Univ. of Texas/Austin Physics Dept. Austin, TX 78712-1020, USA

Elizabeth A. Dobisz

Naval Research Lab. Electronics Science & Technology Div. Code 6864 4555 Overlook Dr. Washington, DC 20375-5347, USA

E. E. Ehrichs

Univ. of Texas Dept. of Physics Austin, TX 78712-1081, USA

Patrick Fay

Univ. of Illinois Dept. of Electrical and Computer Engineering Urbana,IL 61801, USA

Leigh A. Files-Sesler

Texas Instruments Inc. Central Research Labs. MS 134 13588 N. Central Expwy. Dallas, TX 75243-1108, USA

Michael T. Gale

Paul Scherrer Institute Optics Group Badenerstrasse 569 CH-8048 Zürich, Switzerland

François Grey

Aono Atomcraft Project Exploratory Research for Advanced Technology Japan Research Development Corp. Tokodai 5-9-9 Tsukuba, Ibaraki 300-26, Japan

Joseph E.Griffith

AT&T Bell Labs. Rm. 6F-225 P.O. Box 636 Murray Hill, NJ 07974-0636, USA

David A. Grigg

Digital Instruments 520 E. Montecito Santa Barbara, CA 93103-3252

Hans D. Hallen

North Carolina State Univ. Dept. of Physics P.O. Box 8202 Raleigh, NC 27695-8202, USA

Karl Hess

Univ. of Illinois Beckman Institute 405 North Mathews Avenue Urbana, IL 61801-2325, USA

T. K. Higman

Univ. of Minnesota Dept. of Electrical Engineering 200 Union St. SE Minneapolis, MN 55455-0160

D. H. Huang

Aono Atomcraft Project Exploratory Research for Advanced Technology Japan Research Development Corp. Tokodai 5-9-9 Tsukuba, Ibaraki 300-26, Japan

H. J. Hug

Univ. of Basel Institute of Physics Klingelbergstrassse 82 CH-4056 Basel, Switzerland

T. A. Jung

Univ. of Basel Institute of Physics Klingelbergstrassse 82 CH-4056 Basel, Switzerland

Dieter P. Kern

IBM Thomas J. Watson Research Ctr. MS 17-207 P.O. Box 218 Yorktown Heights, NY 10598-0218, USA

A. Kobayashi

Aono Atomcraft Project Exploratory Research for Advanced Technology Japan Research Development Corp. Tokodai 5-9-9 Tsukuba, Ibaraki 300-26, Japan

G. P. Kochanski

AT&T Bell Labs. Murray Hill, NJ 07974, USA

Charles Lieber

Harvard Univ. Applied Sciences Dept. of Chemistry Cambridge, MA 02138, USA

Stuart M.Lindsay

Arizona State Univ. Dept. of Physics Tempe, AZ 85287-0001, USA

Joseph W. Lyding

Univ. of Illinois Dept. of Electrical and Computer Engineering Urbana, IL 61801, USA

Arun Majumdar

Univ. of California/Santa Barbara Dept. of Mechanical & Environmental Engineering Santa Barbara, CA 93106-5070, USA

Herschel M. Marchman

AT&T Bell Labs. Rm. 7E-411 600 Mountain Ave. Murray Hill, NJ 07974-2008, USA

Christie R. K. Marrian

Naval Research Lab. Electronics Science & Technology Div. Code 6864 4555 Overlook Dr. Washington, DC 20375-5347, USA

Sterling E. McBride

Univ. of Texas/Dallas Erik Jonsson School of Engineering and Computer Sciences MP 33 P.O. Box 830688 Richardson, TX 75083-0688, USA

M. A. McCord

IBM Corp. Semiconductor Research and Development Ctr. P.O. Box 218 Yorktown Heights, NY 10598, USA

A. Moser

Univ. of Basel Institute of Physics Klingelbergstrasse 82 CH-4056 Basel, Switzerland

L. P. Muray

Cornell Univ. Knight Lab. National Nanofabrication Facility Ithaca, NY 14853, USA

Munir Nayfeh

Univ. of Illinois/Urbana-Champaign Dept. of Physics 1110W. Green St. Urbana, IL 61801, USA

R.F.W. Pease

Stanford Univ. Solid State Electronics Lab. MC 4055, Electrical Engineering Dept. McCullough 204 Stanford, CA 94305-4055, USA

John N. Randall

Texas Instruments Inc. Central Research Labs. MS 134 13588 N. Central Expressway Dallas, TX 75243-1108, USA

Phillip E.

Russell North Carolina State Univ. Materials Science Dept. P.O.Box 7916 Raleigh, NC 27695-0001, USA

Jason Schneir

National Institute of Standards and Technology Building 220, Room A107 Gaithersburg, MD 20899-0001, USA

U. D. Schwarz

Univ. of Hamburg Institute of Applied Physics Jurginsstrasse 11 20355 Hamburg, Germany

W. F. Smith

Univ. of Texas/Austin Physics Dept. Austin, TX 78712-1020, USA

U. Staufer

Univ. of Basel Institute of Physics Kingelbergstr. 82 CH-4056 Basel, Switzerland

E. C. Teague

National Institute of Standards and Technology Precision Engineering Div. Building 220, Room A117 Gaithersburg, MD 20899, USA

John R. Tucker

Univ. of Illinois Dept. of Electrical and Computer Engineering Urbana, IL 61801, USA

H. Uchida

Aono Atomcraft Project Exploratory Research for Advanced Technology Japan Research Development Corp. Tokodai 5-9-9 Tsukuba, Ibaraki 300-26, Japan

Michael J. Vasile

AT&T Bell Labs. MS 2C-105 600 Mountain Avenue New Providence, NJ 07974-2008, USA

Grover C. Wetsel

Univ. of Texas/Dallas Erik Jonsson School of Engineering and Computer Sciences MP 33 P.O. Box 830688 Richardson, TX 75083-0688, USA

Roland Wiesendanger

Univ. of Basel Dept. of Physics Klingelbergstrasse 82 CH-4056 Basel, Switzerland

© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
"Front Matter: Volume 10310", Proc. SPIE 10310, Technology of Proximal Probe Lithography, 1031001 (3 October 1993); doi: 10.1117/12.2283725; https://doi.org/10.1117/12.2283725
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