3 October 1993 Scanning tunneling microscope-based fabrication and characteerization on passivated semiconductor surfaces
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Proceedings Volume 10310, Technology of Proximal Probe Lithography; 1031007 (1993) https://doi.org/10.1117/12.183198
Event: SPIE Institutes for Advanced Optical Technologies 10, 1993, Bellingham, WA, United States
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John A. Dagata, Jason Schneir, "Scanning tunneling microscope-based fabrication and characteerization on passivated semiconductor surfaces", Proc. SPIE 10310, Technology of Proximal Probe Lithography, 1031007 (3 October 1993); doi: 10.1117/12.183198; https://doi.org/10.1117/12.183198
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