Paper
3 October 1993 Modification and manipulation of layered materials using scanned probe microscopies
Charles Lieber
Author Affiliations +
Proceedings Volume 10310, Technology of Proximal Probe Lithography; 103100D (1993) https://doi.org/10.1117/12.183187
Event: SPIE Institutes for Advanced Optical Technologies 10, 1993, Bellingham, WA, United States
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© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Charles Lieber "Modification and manipulation of layered materials using scanned probe microscopies", Proc. SPIE 10310, Technology of Proximal Probe Lithography, 103100D (3 October 1993); https://doi.org/10.1117/12.183187
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