3 October 1993 Fabrication and characterization using scanned nanoprobes
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Proceedings Volume 10310, Technology of Proximal Probe Lithography; 103100F (1993) https://doi.org/10.1117/12.183189
Event: SPIE Institutes for Advanced Optical Technologies 10, 1993, Bellingham, WA, United States
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Grover C. Wetsel, Grover C. Wetsel, Sterling E. McBride, Sterling E. McBride, Herschel M. Marchman, Herschel M. Marchman, } "Fabrication and characterization using scanned nanoprobes", Proc. SPIE 10310, Technology of Proximal Probe Lithography, 103100F (3 October 1993); doi: 10.1117/12.183189; https://doi.org/10.1117/12.183189
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