29 August 2017 Characterization of a new subpicosecond x-ray streak camera
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Proceedings Volume 10313, Opto-Canada: SPIE Regional Meeting on Optoelectronics, Photonics, and Imaging; 1031305 (2017) https://doi.org/10.1117/12.2283801
Event: Opto-Canada: SPIE Regional Meeting on Optoelectronics, Photonics, and Imaging, 2002, Ottawa, Ontario, Canada
Abstract
In order to study ultrashort laser-produced plasmas, we developped at INRS a subpicosecond x-ray streak camera, called the PX1. The PX1 has been completely characterized.' Using an extraction field of 250 kV/cm, a record 350 fs temporal resolution has been measured with x-ray pulses in the KeV range. Also, we obtained a 40 tim spatial resolution along the 15 mm slit of the photocathode in single-shot. The PX1 has also been used in accumulation mode and a temporal resolution of 800 fs has been obtained with unlimited dynamic range. Recently, in an effort to improve upon these results, a new x-ray streak camera has been developped and tested. This camera, called the FX, uses the new generation of bilamellar tube technology. This includes a better control of the paraxial trajectories, a larger quadripolar lense to increase the usable width of the photocathode and a new design of the electronic lenses to permit the use of higher voltages.
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Vincent Pitre, "Characterization of a new subpicosecond x-ray streak camera", Proc. SPIE 10313, Opto-Canada: SPIE Regional Meeting on Optoelectronics, Photonics, and Imaging, 1031305 (29 August 2017); doi: 10.1117/12.2283801; https://doi.org/10.1117/12.2283801
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