29 August 2017 Feasibility of current mediated amorphous silicon active pixel sensor readout circuits for large area diagnostic medical imaging
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Proceedings Volume 10313, Opto-Canada: SPIE Regional Meeting on Optoelectronics, Photonics, and Imaging; 103133M (2017) https://doi.org/10.1117/12.2283926
Event: Opto-Canada: SPIE Regional Meeting on Optoelectronics, Photonics, and Imaging, 2002, Ottawa, Ontario, Canada
Abstract
The most widely used architecture in large area amorphous silicon (a-Si) flat panel imagers is a passive pixel sensor (PPS), which consists of a detector and a readout switch. While the PPS has the advantage of being compact and amenable towards high-resolution imaging, reading small PPS output signals requires external circuitry such as column charge amplifiers that produce additional noise and reduce the minimum readable sensor input signal. This work presents a current mode amorphous silicon active pixel that performs on-pixel amplification of noise-vulnerable sensor input signals to minimize the effect of external readout noise sources associated with "off-chip" charge amplifiers. Preliminary results [1] indicate excellent small signal linearity along with a high, and programmable, charge gain, which is promising for diagnostic medical imaging. This work examines low frequency a-Si TFT thermal and flicker noise, which contribute to the overall noise performance of the APS.
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K. S. Karim, "Feasibility of current mediated amorphous silicon active pixel sensor readout circuits for large area diagnostic medical imaging", Proc. SPIE 10313, Opto-Canada: SPIE Regional Meeting on Optoelectronics, Photonics, and Imaging, 103133M (29 August 2017); doi: 10.1117/12.2283926; https://doi.org/10.1117/12.2283926
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