PROCEEDINGS VOLUME 10314
OPTIFAB 2003 | 19-22 MAY 2003
Optifab 2003: Technical Digest
IN THIS VOLUME

1 Sessions, 57 Papers, 0 Presentations
OPTIFAB 2003
19-22 May 2003
Rochester, NY, United States
Optifab 2003: Technical Digest
Proc. SPIE 10314, Front Matter: Volume 10314, 1031401 (19 May 2003); doi: 10.1117/12.2283990
Proc. SPIE 10314, Precision grinding of micro-aspherical surface, 1031402 (19 May 2003); doi: 10.1117/12.2283991
Proc. SPIE 10314, Compensation technology of glass molding accuracy, 1031403 (19 May 2003); doi: 10.1117/12.2283992
Proc. SPIE 10314, New method to control form and texture on industrially-sized lenses, 1031404 (19 May 2003); doi: 10.1117/12.2283993
Proc. SPIE 10314, It's the subtleties that make the difference, 1031405 (19 May 2003); doi: 10.1117/12.2283994
Proc. SPIE 10314, Grinding technology of small optical element molds, 1031406 (19 May 2003); doi: 10.1117/12.2283995
Proc. SPIE 10314, Development and demonstration of precision optical contouring by wet etch figuring, 1031407 (19 May 2003); doi: 10.1117/12.2283996
Proc. SPIE 10314, Microwave assisted thermal polishing of aspheric optical glass surfaces by CO2-laser, 1031408 (19 May 2003); doi: 10.1117/12.2283997
Proc. SPIE 10314, Automated figuring and polishing of replication mandrels for X-Ray telescopes, 1031409 (19 May 2003); doi: 10.1117/12.2283998
Proc. SPIE 10314, Pre-polishing on a CNC platform with bound abrasive contour tools, 103140A (19 May 2003); doi: 10.1117/12.2283999
Proc. SPIE 10314, Minimizing chatter in deterministic microgrinding by process parameter selection, 103140B (19 May 2003); doi: 10.1117/12.2284000
Proc. SPIE 10314, New polishing technology for large mirrors and lenses, 103140C (19 May 2003); doi: 10.1117/12.2284001
Proc. SPIE 10314, Fixed abrasive flat lapping with 3M-3M Trizactl diamond tile abrasive pads, 103140D (19 May 2003); doi: 10.1117/12.2284002
Proc. SPIE 10314, Development of nano-machining system and its application, 103140E (19 May 2003); doi: 10.1117/12.2284003
Proc. SPIE 10314, Effects of fluid jet polishing on optical surfaces, 103140F (19 May 2003); doi: 10.1117/12.2284004
Proc. SPIE 10314, New multiwire Fixed Abrasive Slicing Technology (FAST), 103140G (19 May 2003); doi: 10.1117/12.2284005
Proc. SPIE 10314, Mirror grinding of silicon with EPD pellets: applying a constant pressure machining, 103140H (19 May 2003); doi: 10.1117/12.2284006
Proc. SPIE 10314, Optical components manufacturing by room temperature molding, 103140I (19 May 2003); doi: 10.1117/12.2284007
Proc. SPIE 10314, Centration errors: that's great, but…, 103140J (19 May 2003); doi: 10.1117/12.2284008
Proc. SPIE 10314, Fabrication of blanks, figuring, polishing and testing of astronomical mirrors for SALT, VST, LAMOST and other projects, 103140K (19 May 2003); doi: 10.1117/12.2284009
Proc. SPIE 10314, Electroforming of optical tooling in high-strength Ni-Co alloy, 103140L (19 May 2003); doi: 10.1117/12.2284010
Proc. SPIE 10314, Integration of magneto-rheological-finishing (MRF) technology for ultra-precision optical manufacturing, 103140M (19 May 2003); doi: 10.1117/12.2284011
Proc. SPIE 10314, Magnetorheological finishing of a diamond turned poly(methylmethacrylate) flat, 103140N (19 May 2003); doi: 10.1117/12.2284012
Proc. SPIE 10314, Effect of process parameters on surface morphology in MRF, 103140O (19 May 2003); doi: 10.1117/12.2284013
Proc. SPIE 10314, Mechanical behaviour of silica fibers in various moisture conditions, 103140P (19 May 2003); doi: 10.1117/12.2284014
Proc. SPIE 10314, Polishing rate of fused silica, compared to glasses BK7 and SF6, 103140Q (19 May 2003); doi: 10.1117/12.2284015
Proc. SPIE 10314, Study of silica subsurface defects by using cathodoluminescence and trapping of charge measurements, 103140R (19 May 2003); doi: 10.1117/12.2284016
Proc. SPIE 10314, Grain decoration in aluminum oxynitride (ALON) from polishing on bound abrasive laps, 103140S (19 May 2003); doi: 10.1117/12.2284017
Proc. SPIE 10314, Determination of subsurface damage in single crystalline optical materials, 103140T (19 May 2003); doi: 10.1117/12.2284018
Proc. SPIE 10314, Characterizing optical polishing pitch, 103140U (19 May 2003); doi: 10.1117/12.2284019
Proc. SPIE 10314, Light weight mirrors from single crystal silicon, 103140V (19 May 2003); doi: 10.1117/12.2284020
Proc. SPIE 10314, Low thermal expansion pore-less ceramics, 103140W (19 May 2003); doi: 10.1117/12.2284021
Proc. SPIE 10314, Nanocrystalline ceria dispersions for ultrafine polishing and defect reduction in EUVL photomask blank manufacture, 103140X (19 May 2003); doi: 10.1117/12.2284022
Proc. SPIE 10314, Filter design for EDFA to be used for DWDM application, 103140Y (19 May 2003); doi: 10.1117/12.2284023
Proc. SPIE 10314, Cleaning of parts for precision-optic and glass substrates before coating, 103140Z (19 May 2003); doi: 10.1117/12.2284024
Proc. SPIE 10314, Coated optical components for DUV And VUV laser applications, 1031410 (19 May 2003); doi: 10.1117/12.2284025
Proc. SPIE 10314, Optical sol-gel coating production for French high power laser drivers, 1031411 (19 May 2003); doi: 10.1117/12.2284026
Proc. SPIE 10314, Combining optical metrology with mechanical analysis, 1031412 (19 May 2003); doi: 10.1117/12.2284027
Proc. SPIE 10314, Radius tolerancing, 1031413 (19 May 2003); doi: 10.1117/12.2284028
Proc. SPIE 10314, Metrology challenges of thin optical wafers for high finesse etalons, 1031414 (19 May 2003); doi: 10.1117/12.2284029
Proc. SPIE 10314, Transmission spheres more than just a reference surface!, 1031415 (19 May 2003); doi: 10.1117/12.2284030
Proc. SPIE 10314, Hyper-Rayleigh scattering on Third and Second Harmonics from Silver Island films, 1031416 (19 May 2003); doi: 10.1117/12.2284031
Proc. SPIE 10314, Refractive index anisotropy in optics using a birefringence mapper, 1031417 (19 May 2003); doi: 10.1117/12.2284032
Proc. SPIE 10314, High accuracy interferometric measurements of EUVL mask blank substrates, 1031418 (19 May 2003); doi: 10.1117/12.2284033
Proc. SPIE 10314, Short time determination of the standard deviation and the correlation radius of optical surfaces roughness by using their coherent images, 1031419 (19 May 2003); doi: 10.1117/12.2284034
Proc. SPIE 10314, Extending the range of interferometry though subaperture stitching, 103141A (19 May 2003); doi: 10.1117/12.2284035
Proc. SPIE 10314, Novel method for computing reference wave error in optical surface metrology, 103141B (19 May 2003); doi: 10.1117/12.2284036
Proc. SPIE 10314, In-process surface measurement of replication material during UV curing, 103141C (19 May 2003); doi: 10.1117/12.2284037
Proc. SPIE 10314, Lens design for production, 103141D (19 May 2003); doi: 10.1117/12.2284038
Proc. SPIE 10314, The business of precision optics manufacturing: photonics in the Rochester region, 103141E (19 May 2003); doi: 10.1117/12.2284039
Proc. SPIE 10314, Some thoughts on lens assembly and lens centering, 103141F (19 May 2003); doi: 10.1117/12.2284040
Proc. SPIE 10314, Laser beam soldering of micro-optical components, 103141G (19 May 2003); doi: 10.1117/12.2284041
Proc. SPIE 10314, Segmented lens mount for projection optics, 103141H (19 May 2003); doi: 10.1117/12.2284042
Proc. SPIE 10314, Nanoprecision mechanical fabrication for optical elements, 103141I (19 May 2003); doi: 10.1117/12.2284043
Proc. SPIE 10314, Strategies for achieving nano-surface finish with grinding wheel in viewpoint of abrasive grain size, 103141J (19 May 2003); doi: 10.1117/12.2284044
Proc. SPIE 10314, Progress of modern interference layer design methods and coating technologies demonstrated by the manufacturing of uncemented, wide-angle thin film polarizers, 103141K (19 May 2003); doi: 10.1117/12.2284045