2 May 2005 Front Matter: Volume 10315
This PDF file contains the front matter associated with SPIE Proceedings Volume 10315, including the Title Page, Copyright information, Table of Contents, and Conference Committee listing.

The summaries appearing in this book compose the digest of the technical conference cited on the cover and title page of this volume. Summaries were selected and subject to review by the editors and conference program committee. Some conference presentations may not be available for publication. The summaries published in this digest reflect the work and thoughts of the authors and are published herein as submitted. The publisher is not responsible for the validity of the information or for any outcomes resulting from reliance thereon.

Please use the following format to cite material from this book:

Author(s), “Title of Paper,” in Optifab 2005: Technical Digest, SPIE Technical Digest TD03 (SPIE, Bellingham, WA, 2005) page numbers.

ISSN 0277-786X

ISBN 0-8194-5825-2

Published by

SPIE—The International Society for Optical Engineering

P.O. Box 10, Bellingham, Washington 98227-0010 USA

Telephone 1 360/676-3290 (Pacific Time)· Fax 1 360/647-1445


Copyright © 2005, The Society of Photo-Optical Instrumentation Engineers

Copying of material in this book for internal or personal use, or for the internal or personal use of specific clients, beyond the fair use provisions granted by the U.S. Copyright Law is authorized by SPIE subject to payment of copying fees. The Transactional Reporting Service base fee for this volume is $15.00 per article (or portion thereof), which should be paid directly to the Copyright Clearance Center (CCC), 222 Rosewood Drive, Danvers, MA 01923. Payment may also be made electronically through CCC Online at http://www.copyright.com. Other copying for republication, resale, advertising or promotion, or any form of systematic or multiple reproduction of any material in this book is prohibited except with permission in writing from the publisher. The CCC fee code is 0277-786X/05/$15.00.

Printed in the United States of America.

Conference Committee

Conference Chairs

  • Robert E. Fischer, OPTICS 1 Inc. (USA)

  • Masahide Katsuki, Toshiba Machine Company (Japan)

  • Matthias Pfaff, OptoTech Optikmaschinen GmbH (Germany)

  • Kathleen A. Richardson, School of Optics/University of Central Florida (USA)

Program Committee

  • Michael J. Bechtold, OptiPro Systems (USA)

  • Christopher T. Cotton, ASE Optics, Inc. (USA)

  • Walter C. Czajkowski, Edmund Industrial Optics (USA)

  • Michael A. DeMarco, QED Technologies (USA)

  • Edward M. Fess, University of Rochester (USA)

  • John T. Fried, LOH Optical Machinery (USA)

  • Donald Golini, QED Technologies (USA)

  • Heidi Hofke, OptoTech Optical Machinery Inc. (USA)

  • Arne Lindquist, Schneider Optical Machines, LLC (USA)

  • Michael P. Mandina, Optimax Systems, Inc. (USA)

  • Paul Meier-Wang, AccuCoat Inc. (USA)

  • Richard A. Nasca, Corning Tropel Corporation (USA)

  • Michael N. Naselaris, Sydor Optics, Inc. (USA)

  • John J. Nemechek, Fisba Optik LLC (USA)

  • Robert F. Novak, Monroe Community College (USA)

  • Carolyn Russell, QED Technologies (USA)

  • Annette Sansone, University of Rochester (USA)

  • Jim M. Sydor, Sydor Optics, Inc. (USA)

  • David Young, Corning Tropel Corporation (USA)


This conference is the joint effort of SPIE—The International Society for Optical Engineering and APOMA—The American Precision Optics Manufacturers Association to host a forum and venue for worldwide experts and practitioners to gather, share knowledge, and discuss the future of optical fabrication.

The first Optifab conference was successfully held in May 2003 in Rochester, NY, where exhibitors from Europe, the United States, and Japan showcased machinery and equipment for the optical fabrication community and provided the unique opportunity to observe “on-the-shop-floor” demonstrations. Optifab was purposely chosen to alternate with the semi-annual Optatec exhibition in Frankfurt, Germany to provide an optical manufacturing fabrication experience in North America. Responses from our industry colleagues, as well as those from universities who carry out research in optics manufacturing science, have been overwhelmingly positive.

The technical venue of Optifab 2005 continues to leverage the international participation and expertise in the fabrication, processes, materials and metrology areas. The topics for the digest include a diverse range of new and emerging fabrication related technologies across the globe. Authors were asked to concentrate on novel and revolutionary processes, applications, and commercialization of technology rather than research fundamentals. Overall, we believe you will find the technical digest to be a great value and allow you to see first-hand the efforts of the leading international scientists, engineers, and manufacturers in manufacturing methods.

You will find topics to include MRF, glass molding, electroforming, microlenses, and many more advanced technologies. Technologies including telescope optics, free form surfaces, aspheric manufacturing, and other emerging technologies will be presented. Material and surface characterization and chemistry are well covered, as are metrology and testing. Optifab clearly represents a comprehensive state-of-the-art conference where the very latest in a wide variety of methods in optical manufacturing will be presented and discussed.

We express our sincere thanks to all those who worked directly or indirectly to create the program and attract the attendees for a successful conference.

Robert E. Fischer

Masahide Katsuki

Matthias Pfaff

Kathleen A. Richardson

© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
} "Front Matter: Volume 10315", Proc. SPIE 10315, Optifab 2005: Technical Digest, 1031501 (2 May 2005); doi: 10.1117/12.2293191; https://doi.org/10.1117/12.2293191

Back to Top