Paper
23 April 2017 A highly sensitive twist sensor without temperature cross sensitivity based on tapered single-thin-single fiber offset structure
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Proceedings Volume 10323, 25th International Conference on Optical Fiber Sensors; 103235D (2017) https://doi.org/10.1117/12.2267511
Event: 25th International Conference on Optical Fiber Sensors, 2017, Jeju, Korea, Republic of
Abstract
A highly sensitive twist sensor without temperature cross sensitivity based on tapered single mode-thin core-single mode fiber offset structure is proposed and experimentally demonstrated. The two parameters mentioned above can be measured simultaneously without cross sensitivity. The twist sensitivity of 0.12dB/° is achieved by tracking power variation of the resonant wavelength, and the wavelength shift of the spectrum is ±0.01nm. The temperature sensitivity of 0.12nm/°C can be achieved by wavelength demodulation, and the power fluctuation of the spectrum is ±0.015dB. Therefore, the twist and temperature can be detected by the power and wavelength demodulation method, respectively.
© (2017) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Wenjun Ni, Ping Lu, Deming Liu, Jiangshan Zhang, and Shibin Jiang "A highly sensitive twist sensor without temperature cross sensitivity based on tapered single-thin-single fiber offset structure", Proc. SPIE 10323, 25th International Conference on Optical Fiber Sensors, 103235D (23 April 2017); https://doi.org/10.1117/12.2267511
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Cited by 2 scholarly publications.
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KEYWORDS
Demodulation

Sensors

Structured optical fibers

Cladding

Refractive index

Temperature metrology

Single mode fibers

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