15 June 2017 Polishing tool and the resulting TIF for three variable machine parameters as input for the removal simulation
Author Affiliations +
Proceedings Volume 10326, Fourth European Seminar on Precision Optics Manufacturing; 1032602 (2017) https://doi.org/10.1117/12.2267415
Event: Fourth European Seminar on Precision Optics Manufacturing, 2017, Teisnach, Germany
The trend in the optic industry shows, that it is increasingly important to be able to manufacture complex lens geometries on a high level of precision. From a certain limit on the required shape accuracy of optical workpieces, the processing is changed from the two-dimensional to point-shaped processing. It is very important that the process is as stable as possible during the in point-shaped processing. To ensure stability, usually only one process parameter is varied during processing. It is common that this parameter is the feed rate, which corresponds to the dwell time.

In the research project ArenA-FOi (Application-oriented analysis of resource-saving and energy-efficient design of industrial facilities for the optical industry), a touching procedure is used in the point-attack, and in this case a close look is made as to whether a change of several process parameters is meaningful during a processing. The ADAPT tool in size R20 from Satisloh AG is used, which is also available for purchase. The behavior of the tool is tested under constant conditions in the MCP 250 CNC by OptoTech GmbH. A series of experiments should enable the TIF (tool influence function) to be determined using three variable parameters. Furthermore, the maximum error frequency that can be processed is calculated as an example for one parameter set and serves as an outlook for further investigations. The test results serve as the basic for the later removal simulation, which must be able to deal with a variable TIF. This topic has already been successfully implemented in another research project of the Institute for Precision Manufacturing and High-Frequency Technology (IPH) and thus this algorithm can be used.

The next step is the useful implementation of the collected knowledge. The TIF must be selected on the basis of the measured data. It is important to know the error frequencies to select the optimal TIF. Thus, it is possible to compare the simulated results with real measurement data and to carry out a revision. From this point onwards, it is possible to evaluate the potential of this approach, and in the ideal case it will be further researched and later found in the production.
© (2017) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Robert Schneider, Robert Schneider, Alexander Haberl, Alexander Haberl, Rolf Rascher, Rolf Rascher, } "Polishing tool and the resulting TIF for three variable machine parameters as input for the removal simulation", Proc. SPIE 10326, Fourth European Seminar on Precision Optics Manufacturing, 1032602 (15 June 2017); doi: 10.1117/12.2267415; https://doi.org/10.1117/12.2267415


IBF technology for nanomanufacturing technology
Proceedings of SPIE (October 06 2010)
Minimizing tool marks in deterministic microgrinding
Proceedings of SPIE (October 28 1998)
Ion beam figuring (IBF) for high precision optics
Proceedings of SPIE (February 16 2010)
Pilot study for ion beam figuring process
Proceedings of SPIE (October 06 2010)

Back to Top