Dynamic metrology and data processing for precision freeform optics fabrication and testing

Maham Aftab; Isaac Trumper; Lei Huang; Heejoo Choi; Wenchuan Zhao; Logan Graves; Chang Jin Oh; Dae Wook Kim

doi:10.1117/12.2272353

15 June 2017 Dynamic metrology and data processing for precision freeform optics fabrication and testing

Maham Aftab, Isaac Trumper, Lei Huang, Heejoo Choi, Wenchuan Zhao, Logan Graves, Chang Jin Oh, Dae Wook Kim

Author Affiliations +

Proceedings Volume 10326, Fourth European Seminar on Precision Optics Manufacturing; 103260H (2017) https://doi.org/10.1117/12.2272353
Event: Fourth European Seminar on Precision Optics Manufacturing, 2017, Teisnach, Germany

Abstract

Dynamic metrology holds the key to overcoming several challenging limitations of conventional optical metrology, especially with regards to precision freeform optical elements. We present two dynamic metrology systems: 1) adaptive interferometric null testing; and 2) instantaneous phase shifting deflectometry, along with an overview of a gradient data processing and surface reconstruction technique. The adaptive null testing method, utilizing a deformable mirror, adopts a stochastic parallel gradient descent search algorithm in order to dynamically create a null testing condition for unknown freeform optics. The single-shot deflectometry system implemented on an iPhone uses a multiplexed display pattern to enable dynamic measurements of time-varying optical components or optics in vibration. Experimental data, measurement accuracy / precision, and data processing algorithms are discussed.

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Maham Aftab, Maham Aftab, Isaac Trumper, Isaac Trumper, Lei Huang, Lei Huang, Heejoo Choi, Heejoo Choi, Wenchuan Zhao, Wenchuan Zhao, Logan Graves, Logan Graves, Chang Jin Oh, Chang Jin Oh, Dae Wook Kim, Dae Wook Kim, "Dynamic metrology and data processing for precision freeform optics fabrication and testing", Proc. SPIE 10326, Fourth European Seminar on Precision Optics Manufacturing, 103260H (15 June 2017); doi: 10.1117/12.2272353; https://doi.org/10.1117/12.2272353

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