Proceedings Volume 10329 is from: Logo
SPIE OPTICAL METROLOGY
25-29 June 2017
Munich, Germany
Front Matter: Volume 10329
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 1032901 (2017) https://doi.org/10.1117/12.2282982
Interometric Techniques I
Sergej Rothau, Klaus Mantel, Norbert Lindlein
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 1032903 (2017) https://doi.org/10.1117/12.2269720
Johannes Schindler, Christof Pruss, Wolfgang Osten
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 1032904 (2017) https://doi.org/10.1117/12.2270395
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 1032905 (2017) https://doi.org/10.1117/12.2270138
World of Photonics Congress-wide Plenary Session
S. Burk, H. Fedder, J. Wrachtrup
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 1032906 (2017) https://doi.org/10.1117/12.2278897
Interometric Techniques II
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 1032907 (2017) https://doi.org/10.1117/12.2270074
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 1032909 (2017) https://doi.org/10.1117/12.2271189
Shijie Liu, Longbo Xu, Xiao Ma, Zhigang Zhang, You Zhou, Qi Lu, Yunbo Bai, Jianda Shao
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 103290A (2017) https://doi.org/10.1117/12.2269435
Digital Holography and Holographic Microscopy
Pascal Picart, Soumaya Kara Mohammed, Larbi Bouamama, Derradji Bahloul
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 103290B (2017) https://doi.org/10.1117/12.2271744
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 103290C (2017) https://doi.org/10.1117/12.2270150
Annelie Schiller, Tobias Beckmann, Markus Fratz, Dominik Belzer, Alexander Bertz, Daniel Carl, Karsten Buse
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 103290D (2017) https://doi.org/10.1117/12.2270176
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 103290E (2017) https://doi.org/10.1117/12.2271827
Tobias Seyler, Markus Fratz, Tobias Beckmann, Alexander Bertz, Daniel Carl
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 103290F (2017) https://doi.org/10.1117/12.2270087
Pablo D. Ruiz, Jonathan M. Huntley
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 103290G (2017) https://doi.org/10.1117/12.2272003
OCT and Coherence Scanning
Philippe Ackermann, Robert Schmitt
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 103290H (2017) https://doi.org/10.1117/12.2269108
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 103290I (2017) https://doi.org/10.1117/12.2269807
Samuel Lawman, Jinke Zhang, Bryan M. Williams, Yalin Zheng, Yao-Chun Shen
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 103290J (2017) https://doi.org/10.1117/12.2270020
Tobias Boettcher, Marc Gronle, Wolfgang Osten
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 103290K (2017) https://doi.org/10.1117/12.2270270
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 103290L (2017) https://doi.org/10.1117/12.2272041
High-Speed Techniques
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 103290N (2017) https://doi.org/10.1117/12.2269981
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 103290O (2017) https://doi.org/10.1117/12.2270288
Karthik Ram Ramakrishnan, Stephane Corn, Nicolas Le Moigne, Patrick Ienny, Romain Leger, Pierre R. Slangen
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 103290P (2017) https://doi.org/10.1117/12.2271617
Fringe Projection I
Andre Sigel, Markus Merkel, Andreas Heinrich
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 103290Q (2017) https://doi.org/10.1117/12.2269801
Marc Preissler, Chen Zhang, Maik Rosenberger, Gunther Notni
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 103290R (2017) https://doi.org/10.1117/12.2270493
W. Gorschenew, M. Kaestner, Eduard Reithmeier
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 103290S (2017) https://doi.org/10.1117/12.2269986
Fringe Projection II
Jan Burke, Liang Zhong
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 103290T (2017) https://doi.org/10.1117/12.2269946
Lorenz Quentin, Rüdiger Beermann, Andreas Pösch, Eduard Reithmeier, Markus Kästner
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 103290U (2017) https://doi.org/10.1117/12.2269607
Dongliang Zheng, Qian Kemao, Feipeng Da, Hock Soon Seah
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 103290V (2017) https://doi.org/10.1117/12.2270064
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 103290W (2017) https://doi.org/10.1117/12.2269507
Special Session: Spectroscopic Techniques in Industrial and Astronomical Applications
Jake M. Charsley, Richard A. McCracken, Derryck T. Reid, Grzegorz Kowzan, Piotr Maslowski, Ansgar Reiners, Philipp Huke
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 103290Y (2017) https://doi.org/10.1117/12.2271846
M. Genoni, M. Landoni, M. Riva, G. Pariani, E. Mason, P. Di Marcantonio, K. Disseau, I. Di Varano, O. Gonzalez, et al.
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 103290Z (2017) https://doi.org/10.1117/12.2271953
Christoph Doering, Ann-Kathrin Kleinschmidt, Lars Barzen, Johannes Strassner, Henning Fouckhardt
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 1032911 (2017) https://doi.org/10.1117/12.2269708
Huan Liu, Qi Hu, Jiecheng Xie, Yu Fu
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 1032912 (2017) https://doi.org/10.1117/12.2269684
High-Resolution Profiling I
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 1032913 (2017) https://doi.org/10.1117/12.2276581
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 1032914 (2017) https://doi.org/10.1117/12.2269499
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 1032915 (2017) https://doi.org/10.1117/12.2269631
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 1032916 (2017) https://doi.org/10.1117/12.2270185
Erich Grossman
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 1032917 (2017) https://doi.org/10.1117/12.2271863
High-Resolution Profiling II
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 1032918 (2017) https://doi.org/10.1117/12.2270223
Peter de Groot, Danette Fitzgerald
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 1032919 (2017) https://doi.org/10.1117/12.2269800
Wei-Chung Wang, Ming-Hsing Shen, Chi-Hung Hwang, Yun-Ting Yu, Tzu-Fong Wang
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 103291A (2017) https://doi.org/10.1117/12.2270195
Maria Gritsevich, Göran Maconi, Anton Nolvi, Ivan Kassamakov, Antti Penttilä, Karri Muinonen, Edward Hæggström
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 103291B (2017) https://doi.org/10.1117/12.2269519
Joint Session I: High-Precision Measurement of Optical Components and Systems
Sören Laubach, Gerd Ehret, Jörg Riebling, Peter Lehmann
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 103291D (2017) https://doi.org/10.1117/12.2269520
Holger Knell, Hans-Martin Heuck
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 103291F (2017) https://doi.org/10.1117/12.2270194
Joint Session II: High-Precision Measurement of Optical Components and Systems
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 103291G (2017) https://doi.org/10.1117/12.2276582
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 103291I (2017) https://doi.org/10.1117/12.2268989
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 103291K (2017) https://doi.org/10.1117/12.2270284
Speckle Metrology
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 103291M (2017) https://doi.org/10.1117/12.2270258
K. Mantel, V. Nercissian
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 103291N (2017) https://doi.org/10.1117/12.2269429
Robert Kowarsch, Jiajun Zhang, Carmen Sguazzo, Stefan Hartmann, Christian Rembe
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 103291O (2017) https://doi.org/10.1117/12.2269988
Stefan Patzelt, Dirk Stöbener, Gerald Ströbel, Andreas Fischer
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 103291P (2017) https://doi.org/10.1117/12.2269171
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 103291Q (2017) https://doi.org/10.1117/12.2269739
In-situ and Nondestructive Testing I
Wei-Chung Wang, Po-Chi Sung
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 103291R (2017) https://doi.org/10.1117/12.2276583
Tobias Binkele, David Hilbig, Friedrich Fleischmann, Thomas Henning
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 103291S (2017) https://doi.org/10.1117/12.2270291
Jan-Hendrik Hagemann, Claas Falldorf, Gerd Ehret, Ralf B. Bergmann
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 103291T (2017) https://doi.org/10.1117/12.2269932
M. E. Benedet, F. J. Macedo, A. V. Fantin, D. P. Willemann, F. A. A. Silva, S. D. Soares, A. Albertazzi Jr.
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 103291V (2017) https://doi.org/10.1117/12.2270289
I. V. Semenova, A. V. Belashov, F. E. Garbuzov, A. M. Samsonov, A. A. Semenov
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 103291W (2017) https://doi.org/10.1117/12.2270375
In-situ and Nondestructive Testing II
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 103291X (2017) https://doi.org/10.1117/12.2276584
Mike Bermuske, Lars Büttner, Jürgen Czarske
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 103291Y (2017) https://doi.org/10.1117/12.2270263
Thomas O. H. Charrett, Yashwanth K. Bandari, Florent Michel, Jialuo Ding, Stewart W. Williams, Ralph P. Tatam
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 103291Z (2017) https://doi.org/10.1117/12.2269989
Johannes Gürtler, Felix Greiffenhagen, Jakob Woisetschläger, Daniel Haufe, Jürgen Czarske
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 1032920 (2017) https://doi.org/10.1117/12.2269717
François M. Torner, Abdullah Karatas, Matthias Eifler, Indek Raid, Jörg Seewig
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 1032922 (2017) https://doi.org/10.1117/12.2270257
In-situ and Nondestructive Testing III
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 1032924 (2017) https://doi.org/10.1117/12.2269939
Thomas Kissinger, Edmon Chehura, Stephen W. James, Ralph P. Tatam
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 1032925 (2017) https://doi.org/10.1117/12.2269985
F. M. Inochkin, S. K. Kruglov, I. G. Bronshtein, T. A. Kompan, S. V. Kondratjev, A. S. Korenev, N. F. Pukhov
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 1032926 (2017) https://doi.org/10.1117/12.2270204
Posters--Tuesday
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 1032928 (2017) https://doi.org/10.1117/12.2271603
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 1032929 (2017) https://doi.org/10.1117/12.2271978
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 103292A (2017) https://doi.org/10.1117/12.2269386
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 103292B (2017) https://doi.org/10.1117/12.2269392
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 103292D (2017) https://doi.org/10.1117/12.2270117
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 103292E (2017) https://doi.org/10.1117/12.2270140
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 103292F (2017) https://doi.org/10.1117/12.2270160
Christian Beder, Martin Peschka
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 103292G (2017) https://doi.org/10.1117/12.2270222
Xiwen Qiang, Tianhua Liu, Shuanglian Feng, Fei Zong, Min Wu, Jinyong Chang, Junwei Zhao
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 103292H (2017) https://doi.org/10.1117/12.2270254
B. Nelsen, P. Jacobs, P. Hartmann
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 103292I (2017) https://doi.org/10.1117/12.2270264
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 103292J (2017) https://doi.org/10.1117/12.2270304
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 103292K (2017) https://doi.org/10.1117/12.2270308
Philipp Huke, Livia Origlia, Marco Riva, Jake Charsley, Richard McCracken, Derryck Reid, Grzegorz Kowzan, Piotr Maslowski, Karen Disseau, et al.
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 103292M (2017) https://doi.org/10.1117/12.2271782
Maximilian Fisser, Rodney A. Badcock, Paul D. Teal, Adam Swanson, Arvid Hunze
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 103292P (2017) https://doi.org/10.1117/12.2267091
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 103292Q (2017) https://doi.org/10.1117/12.2268064
Michael Gisi, Armin Stettner, Roland Seurig, Atle Honne, Johannes Witt, Pierre Rebeyre
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 103292R (2017) https://doi.org/10.1117/12.2268146
Göran Maconi, Ivan Kassamakov, Antti Penttilä, Maria Gritsevich, Edward Hæggström, Karri Muinonen
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 103292S (2017) https://doi.org/10.1117/12.2269518
Rüdiger Beermann, Lorenz Quentin, Andreas Pösch, Eduard Reithmeier, Markus Kästner
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 103292T (2017) https://doi.org/10.1117/12.2269724
M. Yokota, F. Aoyama
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 103292U (2017) https://doi.org/10.1117/12.2270071
Aiganym M. Sakhariyanova, Igor A. Konyakhin, Renpu Li
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 103292V (2017) https://doi.org/10.1117/12.2270077
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 103292W (2017) https://doi.org/10.1117/12.2270108
P. Dwivedi, A. P. Konijnenberg, S. F. Pereira, H. P. Urbach
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 103292Y (2017) https://doi.org/10.1117/12.2270165
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 103292Z (2017) https://doi.org/10.1117/12.2270186
Gustavo Gutierrez, David Hilbig, Friedrich Fleischmann, Thomas Henning
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 1032930 (2017) https://doi.org/10.1117/12.2270247
Ch. Taudt, T. Baselt, B. Nelsen, H. Assmann, A. Greiner, E. Koch, P. Hartmann
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 1032932 (2017) https://doi.org/10.1117/12.2270318
Rob Snel, Jasper Winters, Thomas Liebig, Wouter Jonker
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 1032933 (2017) https://doi.org/10.1117/12.2270711
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 1032934 (2017) https://doi.org/10.1117/12.2271297
O. R. Ranjbar-Naeini, F. Jafari, P. Zarafshani, M. I. Zibaii, H. Latifi
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 1032936 (2017) https://doi.org/10.1117/12.2272013
Daodang Wang, Zhichao Wang, Rongguang Liang, Ming Kong, Jun Zhao, Jufeng Zhao, Linhai Mo, Wei Li
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 1032937 (2017) https://doi.org/10.1117/12.2268052
Phong V. Hoang, Igor A. Konyakhin
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 1032938 (2017) https://doi.org/10.1117/12.2269118
I. Fortmeier, M. Stavridis, C. Elster, M. Schulz
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 1032939 (2017) https://doi.org/10.1117/12.2269122
Anna V. Trushkina, Victoria A. Ryzhova, Valery V. Korotaev, Victor M. Denisov, Andrey V. Radilov
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 103293A (2017) https://doi.org/10.1117/12.2269424
Chih-Wei Chiang, Hong-Wei Chiang, Huann-Ming Chou, Shu-Huang Sun, Jiann-Shen Lee
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 103293B (2017) https://doi.org/10.1117/12.2269487
Anton Nogin, Igor Konyakhin
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 103293C (2017) https://doi.org/10.1117/12.2269527
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 103293D (2017) https://doi.org/10.1117/12.2269653
D. S. Lushnikov, A. Y. Zherdev, S. B. Odinokov, V. V. Markin, O. A. Gurylev, M. V. Shishova
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 103293E (2017) https://doi.org/10.1117/12.2269712
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 103293F (2017) https://doi.org/10.1117/12.2269746
Changyeun Mo, Giyoung Kim, Jongguk Lim
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 103293G (2017) https://doi.org/10.1117/12.2269895
Proceedings Volume Optical Measurement Systems for Industrial Inspection X, 103293H (2017) https://doi.org/10.1117/12.2269914