Abstract
This PDF file contains the front matter associated with SPIE Proceedings Volume 10329 including the Title Page, Copyright information, Table of Contents, Introduction, and Conference Committee listing.
Lehmann, Osten, and Gonçalves: Front Matter: Volume 10329

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Author(s), “Title of Paper,” in Optical Measurement Systems for Industrial Inspection X, edited by Peter Lehmann, Wolfgang Osten, Armando Albertazzi Gonçalves Jr., Proceedings of SPIE Vol. 10329 (SPIE, Bellingham, WA, 2017) Seven-digit Article CID Number.

ISSN: 0277-786X

ISSN: 1996-756X (electronic)

ISBN: 9781510611030

ISBN: 9781510611047 (electronic)

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Authors

Numbers in the index correspond to the last two digits of the seven-digit citation identifier (CID) article numbering system used in Proceedings of SPIE. The first five digits reflect the volume number. Base 36 numbering is employed for the last two digits and indicates the order of articles within the volume. Numbers start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B…0Z, followed by 10-1Z, 20-2Z, etc.

Ackermann, Philippe, 0H

Ahmadi Rashtabadi, H., 3T

Aizu, Yoshihisa, 3H

Alatawi, Ayshah, 2B

Albertazzi, A., 1V

Angervaks, A. E., 2Z

Aoyama, F., 2U

Arai, Y., 1Q

Assmann, H., 32

Ayubi, Gastón A., 3W

Badcock, Rodney A., 2P

Bahloul, Derradji, 0B

Bai, Yunbo, 0A

Bandari, Yashwanth K., 1Z

Bang, Ole, 0I

Baricholo, Peter, 2Q

Barzen, Lars, 11

Baselt, T., 32

Bauer, J., 3J

Baumgart, Marcus, 34

Beckmann, Tobias, 0D, 0F

Beder, Christian, 2G

Beermann, Rüdiger, 0U, 2T

Belashov, A. V., 1W

Beloivan, P. A., 3V

Beltran-Gonzalez, A., 4P

Belzer, Dominik, 0D

Benedet, M. E., 1V

Berberova, Nataliya, 3Y

Bergmann, Ralf B., 1T

Bermudez, C., 15

Bermuske, Mike, 1Y

Bertz, Alexander, 0D, 0F

Bianco, Vittorio, 0E

Bichra, Mohamed, 1K

Binkele, Tobias, 1S

Bischoff, Jörg, 16

Blokhina, Anastasia A., 2K, 4M

Bluemich, A., 3J

Boden, Fritz, 2J

Boettcher, Tobias, 0K

Bointon, P., 0W

Boisse, Isabelle, 2M

Bouamama, Larbi L., 0B

Bradu, A., 2D

Brand, Uwe, 44

Brandenburg, Albrecht, 2A

Bräuer-Burchardt, Christian, 0N

Breitbarth, Andreas, 0O

Broeg, Christopher, 2M

Bronshtein, I. G., 26

Buchta, Zdeněk, 3I

Burada, Dali R., 1K

Burk, S., 06

Burke, Jan, 0T

Burtseva, Anastasiia A., 4T

Buse, Karsten, 0D

Büttner, Lars, 1Y

Cadevall, C., 15

Cao, Zhen, 3N

Carl, Daniel, 0D, 0F

Chang, Jinyong, 2H

Chapalo, Ivan, 45

Charrett, Thomas O. H., 1Z

Charsley, Jake M., 0Y, 2M

Chehura, Edmon, 25

Chen, Lei, 09, 29

Chertov, Aleksandr N., 46

Chiang, Chih-Wei, 3B

Chiang, Hong-Wei, 3B

Chou, Huann-Ming, 3B

Číp, Ondřej, 3I

Cizek, Martin, 43

Coppola, S., 4Q

Corn, Stephane, 0P

Correns, Martin, 0O

Coupland, Jeremy M., 0L

Czarske, Jürgen, 1Y, 20, 24

Da, Feipeng, 0V

Dai, Yifan, 4S

de Groot, Peter, 19

Demian, D., 2D

Denisov, Victor M., 2K, 3A

Di Marcantonio, P., 0Z

Ding, Jialuo, 1Z

Disseau, Karen, 0Z, 2M

Di Varano, I., 0Z

Doan, Van Bac, 2Z

Doering, Christoph, 11

Dolon, François, 2M

Du, Shaojun, 4E

Dubrov, Alexandre V., 42

Dubrov, Vladimir D., 42

Duma, V.-F., 2D

Dwivedi, P., 2Y

Ehret, Gerd, 1D, 1T

Elster, C., 39

Ermolaev, Petr A., 3D

Ezhova, Kseniia V., 4T

Fabrika, Sergei N., 3R

Falldorf, Claas, 1T

Fantin, A. V., 1V

Fedder, H., 06

Fei, Zixuan, 4U, 4X

Feng, Shuanglian, 2H

Ferrari, Luca, 4O

Ferraro, Pietro, 0E, 4Q

Ferreira, Carlos, 4C

Feuchter, Thomas, 0I

Finizio, Andrea, 0E

Fischer, Andreas, 1P

Fisser, Maximilian, 2P

Fitzgerald, Danette, 19

Fleischmann, Friedrich, 1S, 30

Fortmeier, I., 39

Fouckhardt, Henning, 11

Fratz, Markus, 0D, 0F

Frolov, D. N., 3V

Fu, Yu, 12

Funamizu, Hideki, 3H

Fursenko, O., 3J

Gao, Xiao Fei, 4U, 4V

Gao, Zhishan, 29

Garbuzov, F. E., 1W

García, Javier, 48, 4C

Garcia-Torales, G., 4P

Genoni, M., 0Z

Georges, Marc P., 1M

Gisi, Michael, 2R

Głomb, Grzegorz, 3P

Gollor, Pascal, 40

Gonzalez, O., 0Z

Gorbachev, Alexey A., 4F

Gorbunova, Elena V., 46

Gorecki, Christophe, 0C

Gorschenew, W., 0S

Granero, L., 48

Greiffenhagen, Felix, 20

Greiner, A., 32

Grilli, S., 4Q

Gritsevich, Maria, 1B, 2S

Gronle, Marc, 0K, 14

Grossman, Erich, 17

Guo, Jia Yu, 4V, 4X

Guo, Xiaoli, 3O

Gurov, Igor, 4I

Gürtler, Johannes, 20

Gurylev, O. A., 3E

Gusarov, Vadim F., 4J, 4L

Gutierrez, Gustavo, 30

Hæggström, Edward, 1B, 2S

Hagemann, Jan-Hendrik, 1T

Hagemeier, Sebastian, 16

Han, Christopher B., 3K

Han, Sen, 3K

Hartmann, P., 1I, 2I, 32

Hartmann, Stefan, 1O

Haufe, Daniel, 20

Hayasaki, Yoshio, 07

Heinrich, Andreas, 0Q

Heinrich, F., 3J

Heist, Stefan, 0N

Hennelly, Bryan, 2W

Henning, Thomas, 1S, 30

Heuck, Hans-Martin, 1F

Hilbig, David, 1S, 30

Hoang, Anh Phuong, 4F

Hoang, Phong V., 38

Hola, Miroslava, 43

Holz, Philipp, 2A

Honne, Atle, 2R

Hrabina, Jan, 43

Hsieh, Hung-Lin, 3S, 3Z

Hu, Guohang, 3N

Hu, Qi, 12

Huang, Y. G., 3Z

Huang, Ya, 29

Hucl, Vaclav, 43

Huke, Philipp, 0Y, 0Z, 2M

Huntley, Jonathan M., 0G

Hunze, Arvid, 2P

Hutiu, Gh., 2D

Hwang, Chi-Hung, 1A

Ienny, Patrick, 0P

Inochkin, F. M., 26

Israelsen, Niels M., 0I

Ivanov, Branimir, 3Y

Ivanov, Nikita, 4I

Ivanov, S. A., 2Z

Jacobs, P., 2I

Jafari, F., 36

James, Stephen W., 25

Jelínek, Michal, 43

Jha, Diwaker, 3X

Jin, Rui, 4W

Jonker, Wouter, 33

Józwik, Michal, 0C

Kara Mohammed, Soumaya, 0B

Karasik, Valerii E., 2F

Kassamakov, Ivan, 1B, 2S

Kästner, Markus, 0S, 0U, 2T

Kemao, Qian, 0V

Khan, Gufran S., 1K

Kim, Giyoung, 3G

Kissinger, Thomas, 25

Kleinschmidt, Ann-Kathrin, 11

Kleshchenok, Maksim A., 4L, 4M

Klimov, Aleksandr A., 4J

Knell, Holger, 1F

Koch, E., 32

Koenders, Ludger, 44

Kompan, T. A., 26

Kondratjev, S. V., 26

Kong, Ming, 37

Kong, Xinxin, 05, 2E, 3O

Konijnenberg, A. P., 2Y

Konyakhin, Igor A., 2V, 38, 3C, 4H

Korenev, A. S., 26

Korhonen, Heidi, 0Z, 2M

Kornilin, Dmitriy V., 4K

Korolev, Timofey K., 3F

Korotaev, Valery V., 2K, 3A, 46, 4M

Kostencka, Julianna, 0C, 2W

Kotov, Oleg, 45

Kowarsch, Robert, 1O

Kowzan, Grzegorz, 0Y, 2M

Kozacki, Tomasz, 0C, 2W

Krauter, Johann, 14

Kroupa, Gerhard, 34

Kruglov, S. K., 26

Kudryavtsev, Ilya A., 4K

Kuehnhold, Peter, 40

Kühmstedt, Peter, 0N

Kujawińska, Małgorzata, 3X

Kuschmierz, Robert, 24

Landoni, M., 0Z

Languy, Fabian, 1M

Latifi, H., 36

Latyev, Svjatoslav M., 3U, 3V

Laubach, Sören, 1D

Lawman, Samuel, 0J

Lazar, Josef, 43

Lazarev, Vladimir A., 2F

Leach, Richard K., 0L, 0W

Lecler, Sylvain, 18

Lee, Jiann-Shen, 3B

Lee, Ju-Yi, 3S, 3Z

Leger, Romain, 0P

Lehmann, Peter, 16, 1D, 40

Le Moigne, Nicolas, 0P

Lempa, C., 1I

Lenzini, Nicola, 4O

Leong-Hoï, Audrey, 18

Leonov, Stanislav O., 2F

Lešundák, Adam, 3I

Li Causi, Gianluca, 0Z

Li, Dong, 4W, 4X

Li, Huan Huan, 4V, 4X

Li, Jia, 28

Li, Renpu, 2V

Li, Wei, 37

Li, Xueyuan, 3K

Li, Yang, 2E, 3O

Li, Yang, 3Q

Li, Yu Qin, 4V

Li, Zhi, 44

Liang, A. J., 3Z

Liang, Rongguang, 37

Liebig, Thomas, 33

Lim, Jongguk, 3G

Lin, Zhi Ying, 3S

Lindlein, Norbert, 03

Liu, Huan, 12

Liu, Qinggang, 3Q

Liu, Shijie, 0A, 3N

Liu, Tianhua, 2H

Liu, Wenguang, 4E

Liżewski, Kamil, 3X

Lobanova, Anastasiya Y., 2K

Lu, Qi, 0A

Lu, Qing, 28

Ludwikowski, Krzysztof, 2J

Lushnikov, D. S., 3E

Lutz, Christian, 2A

Lv, Xiaoyu, 2E, 3O

Ma, Jun, 29

Ma, Xiao, 0A

Macedo, F. J., 1V

Maconi, Göran, 1B, 2S

Mai, A., 3J

Manske, Eberhard, 16

Mantel, Klaus, 03, 1N

Maraev, Anton A., 4J

Margaryants, Nikita, 4I

Maria, Michael, 0I

Mariné, J., 15

Markin, V. V., 3E

Marschmeyer, S., 3J

Martínez, D., 15

Maslowski, Piotr, 0Y, 2M

Mason, E., 0Z

Mastylo, Rostyslav, 16

Mat Jafri, Mohd. Zubir, 4D, 4G

Mateev, Georgy, 3Y

Matilla, A., 15

McCracken, Richard A., 0Y, 2M

McMillan, Alison J., 4K

Mednikov, Sergey V., 4J

Memmolo, Pasquale, 0E

Méndez, Alexis, 1X

Merkel, Markus, 0Q

Michel, Florent, 1Z

Micó, Vicente, 48, 4C

Mikel, Bretislav, 43

Mikuła, Marta, 0C

Millerd, James E., 1G

Milton-Garduno, J., 4P

Mirzade, Fikret Kh., 42

Mishra, Vinod, 1K

Mitrofanov, Sergey S., 3L

Mo, Changyeun, 3G

Mo, Linhai, 37

Mollabashi, M., 3T

Montgomery, Paul C., 18

Mroczka, Janusz, 3P

Muinonen, Karri, 1B, 2S

Muslimov, Eduard R., 3R

Mutter, Kussay Nugamesh, 4D, 4G

Nasti, G., 4Q

Naumova, Anastasiia I., 3U

Nazarova, Dimana, 3Y

Neethling, Pieter H., 2Q

Nekrylov, Ivan S., 4L, 4M

Nelsen, B., 2I, 32

Nercissian, V., 1N

Nikonorov, N. V., 2Z

Nogin, Anton, 3C

Nolvi, Anton, 1B

North-Morris, Michael, 1G

Notni, Gunther, 0N, 0O, 0R

Odinokov, S. B., 3E

Okun', R. A., 2Z

Oliva, Ernesto, 2M

Olivieri, F., 4Q

Onodera, Yusei, 3H

Origlia, Livia, 2M

Osanlou, Ardeshir, 4K

Osten, Wolfgang, 04, 0K, 14

Ota, Kazuki, 07

Ottevaere, Heidi, 3X

Ottogalli, Sebastien, 2M

Pagliarulo, V., 4Q

Pant, Kamal K., 1K

Pariani, G., 0Z

Paturzo, Melania, 0E

Patzelt, Stefan, 1P

Peng, Xiaoqiang, 4S

Penttilä, Antti, 1B, 2S

Pepe, Francesco, 2M

Pereira, S. F., 2Y

Peretyagin, Vladimir S., 3F

Perrin, Stéphane, 18

Perruchot, Sandrine, 2M

Peschka, Martin, 2G

Petrochenko, Andrey, 4H

Petzold, U., 1I

Pfeiffer, Pierre, 18

Pham, Minh Tuan, 3I

Piano, S., 0W

Picart, Pascal, 0B

Picazo-Bueno, José Ángel, 4C

Pikálek, Tomáš, 3I

Podoleanu, Adrian, 0I, 2D

Pösch, Andreas, 0U, 2T

Potemkin, Andrey, 4I

Povarov, Kirill S., 3L

Pravdová, Lenka, 3I

Preissler, Marc, 0R

Pruss, Christof, 04

Pukhov, N. F., 26

Pulwer, S., 3J

Puranto, Prabowo, 44

Qiang, Xiwen, 2H

Qin, Zirui, 3Q

Quentin, Lorenz, 0U, 2T

Radilov, Andrey V., 3A

Ramakrishnan, Karthik Ram, 0P

Ranjbar-Naeini, O. R., 36

Ratcliffe, Ian, 4K

Razi, S., 3T

Reardon, Patrick J., 2B

Rebeyre, Pierre, 2R

Reichel, S., 1I

Reid, Derryck T., 0Y, 2M

Reiners, Ansgar, 0Y, 2M

Reithmeier, Eduard, 0S, 0U, 2T

Rembe, Christian, 1O

Repin, Vladislav A., 46

Rerucha, Simon, 43

Riebling, Jörg, 1D

Riva, Marco, 0Z, 2M

Rohwer, Erich G., 2Q

Rosenberger, Maik, 0O, 0R

Rothau, Sergej, 03

Rovati, Luigi, 4O

Rubio, R., 48

Ruiz, Pablo D., 0G

Ryzhova, Victoria A., 2K, 3A

Saint-Georges, Philippe, 1M

Sakhariyanova, Aiganym M., 2V

Samokhvalov, Andrey, 4I

Samsonov, A. M., 1W

Sanz, M., 48

Sarajlic, Mirsad, 2M

Šarbort, Martin, 3I

Schäfer, Sebastian, 2M

Schambach, Jörg, 0O

Schiller, Annelie, 0D

Schindler, Johannes, 04

Schmidt, Ingo, 0N

Schmitt, Robert, 0H

Schrader, S., 3J

Schröder, Andreas, 2J

Schulz, M., 39

Seah, Hock Soon, 0V

Semenov, A. A., 1W

Semenova, I. V., 1W

Seurig, Roland, 2R

Seyler, Tobias, 0F

Sguazzo, Carmen, 1O

Shakher, Chandra, 1K

Shao, Jianda, 0A, 3N

Shelygina, Svetlana, 4I

Shen, Hua, 28

Shen, Ming-Hsing, 1A

Shen, Yao-Chun, 0J

Sheridan, John T., 2W

Shi, Feng, 4S

Shishova, M. V., 3E

Sigel, Andre, 0Q

Silva, F. A. A., 1V

Sims-Waterhouse, D., 0W

Sinzinger, Stefan, 1K

Slangen, Pierre R., 0P

Smirnov, Nikolai V., 3U

Snel, Rob, 33

Soares, S. D., 1V

Stasicki, Bolesław, 2J

Stavridis, M., 39

Steglich, P., 3J

Stettner, Armin, 2R

Stöbener, Dirk, 1P

Stoykova, Elena, 3Y

Strassner, Johannes, 11

Ströbel, Gerald, 1P

Strojnik, M., 4P

Su, Rong, 0L

Suliali, Nyasha J., 2Q

Sun, B. Y., 3Z

Sun, Shu-Huang, 3B

Sung, Po-Chi, 1R

Swanson, Adam, 2P

Świrniak, Grzegorz, 3P

Sycheva, Elena A., 4L

Tang, Shouhong, 3K

Tarabrin, Mikhail K., 2F

Tatam, Ralph P., 1Z, 25

Taudt, Ch., 32

Teal, Paul D., 2P

Tereschenko, Stanislav, 40

Theska, R., 3V

Timofeev, Aleksandr N., 4J, 4L

Tortschanoff, Andreas, 34

Trifanov, Oleg V., 4T

Trushkina, Anna V., 3A

Trusiak, Maciej, 3X

Uozumi, Jun, 3H

Urbach, H. P., 2Y

Valyavin, Gennady G., 3R

Vandenrijt, Jean-François, 1M

Veroone, G., 4P

Vespini, V., 4Q

Villringer, C., 3J

Volkov, Mikhail, 4I

Volynsky, Maxim A., 3D

Voznesenskaia, Mariia, 3X

Voznesenskiy, Nikolay, 3X

Wan, Wen, 4S

Wang, Chao, 4X

Wang, Daodang, 37

Wang, Quanzhao, 3K

Wang, Tzu-Fong, 1A

Wang, Wei-Chung, 1A, 1R

Wang, Yuhang, 0L

Wang, Zhichao, 37

Willemann, D. P., 1V

Williams, Bryan M., 0J

Williams, Stewart W., 1Z

Winters, Jasper, 33

Witt, Johannes, 2R

Woisetschläger, Jakob, 20

Wolff, Helmut, 44

Wrachtrup, J., 06

Wu, Min, 2H

Wu, Zhou, 05, 2E, 3O

Xiangli, Bin, 05, 2E

Xie, Jiecheng, 12

Xie, Weichang, 16

Xu, Changda, 4W

Xu, Longbo, 0A

Yacoot, Andrew, 44

Yan, Baozhu, 4E

Yang, Tao, 4V

Yang, Yi, 4E

Ye, Xin, 3K

Yeoh, Stephenie, 4D, 4G

Yokota, M., 2U

Yu, Yun-Ting, 1A

Yuan, Caojin, 29

Yue, Chong, 3Q

Zalevsky, Zeev, 4C

Zarafshani, P., 36

Zavalov, Yuri N., 42

Zhang, Chen, 0O, 0R

Zhang, Guanliang, 4U, 4W

Zhang, Hao, 24

Zhang, Jiajun, 1O

Zhang, Jinke, 0J

Zhang, Rui, 09

Zhang, Wenxi, 05, 2E, 3O

Zhang, Zhigang, 0A

Zhao, Jufeng, 37

Zhao, Jun, 37

Zhao, Junwei, 2H

Zhao, Yuan'an, 3N

Zheng, Donghui, 09

Zheng, Dongliang, 0V

Zheng, Yalin, 0J

Zherdev, A. Y., 3E

Zhong, Liang, 0T

Zhou, Changhe, 13

Zhou, Qiong, 4E

Zhou, Xiang, 4U, 4V, 4W, 4X

Zhou, You, 0A

Zhu, Meiping, 3N

Zhu, Rihong, 09, 28, 29

Zhu, Wenhua, 09

Zhukova, Ekaterina, 4I

Zibaii, M. I., 36

Zimmermann, Manuel, 0O

Zong, Fei, 2H

Conference Committee

Symposium Chair

  • Wolfgang Osten, Universität Stuttgart (Germany)

Conference Chair

  • Peter Lehmann, Universität Kassel (Germany)

Conference Co-chairs

  • Wolfgang Osten, Universität Stuttgart (Germany)

  • Armando Albertazzi Gonçalves Jr., Universidade Federal de Santa Catarina (Brazil)

Conference Programme Committee

  • Oleg V. Angelsky, Yuriy Fedkovych Chernivtsi National University (Ukraine)

  • Anand Krishna Asundi, Nanyang Technological University (Singapore)

  • Partha P. Banerjee, University of Dayton (United States)

  • Ralf B. Bergmann, Bremer Institut für angewandte Strahltechnik GmbH (Germany)

  • Harald Bosse, Physikalisch-Technische Bundesanstalt (Germany)

  • Jan Burke, Fraunhofer-Institut für Optronik, Systemtechnik und Bildauswertung (Germany)

  • Chau-Jern Cheng, National Taiwan Normal University (Taiwan)

  • Yuri V. Chugui, Technological Design Institute of Scientific Instrument Engineering (Russian Federation)

  • Wim M.J. Coene, ASML Netherlands B.V. (Netherlands)

  • Jürgen W. Czarske, TU Dresden (Germany)

  • Peter J. de Groot, Zygo Corporation (United States)

  • Pietro Ferraro, Istituto di Scienze applicata e Sistemi Intelligenti (Italy)

  • Cosme Furlong, Worcester Polytechnic Institute (United States)

  • Marc P. Georges, Universiteit de Liège (Belgium)

  • Christophe Gorecki, FEMTOST (France)

  • Sen Han, University of Shanghai for Science and Technology (China)

  • Yoshio Hayasaki, Utsunomiya University (Japan)

  • Myung K. Kim, University of South Florida (United States)

  • Tomasz Kozacki, Warsaw University of Technology (Poland)

  • Eberhard Manske, Technische Universität Ilmenau (Germany)

  • Andrew John Moore, Heriot-Watt University (United Kingdom)

  • Gunther Notni, Fraunhofer-Institut für Angewandte Optik und Feinmechanik (Germany)

  • Yukitoshi Otani, Utsunomiya University (Japan)

  • YongKeun Park, KAIST (Korea, Republic of)

  • Pascal Picart, Université du Maine (France)

  • Christian Rembe, Technische Universität Clausthal (Germany)

  • Robert Schmitt, RWTH (Germany)

  • Jörg Seewig, Technische Universität Kaiserslautern (Germany)

  • Pierre R. Slangen, Mines Alès (France)

  • Cristina Trillo, Universidad de Vigo (Spain)

  • Rainer Tutsch, Technische Universität Braunschweig (Germany)

  • Eriko Watanabe, The University of Electro-Communications (Japan)

  • Toyohiko Yatagai, Utsunomiya University (Japan)

  • Changhe Zhou, Shanghai Institute of Optics and Fine Mechanics (China)

  • Rihong Zhu, Nanjing University of Science and Technology (China)

Session Chairs

  • 1 Interometric Techniques I

    Wolfgang Osten, Universität Stuttgart (Germany)

    Peter Lehmann, Universität Kassel (Germany)

  • 2 Interometric Techniques II

    Pascal Picart, Université du Maine (France)

  • 3 Digital Holography and Holographic Microscopy

    Pietro Ferraro, Istituto di Scienze applicata e Sistemi Intelligenti (Italy)

  • 4 OCT and Coherence Scanning

    Christian Rembe, Technische Universität Clausthal (Germany)

  • 5 High-Speed Techniques

    Ralf B. Bergmann, Bremer Institut für angewandte Strahltechnik GmbH

    (Germany)

  • 6 Fringe Projection I

    Jan Burke, Fraunhofer-Institut für Optronik, Systemtechnik und

    Bildauswertung (Germany)

  • 7 Fringe Projection II

    Eberhard Manske, Technische Universität Ilmenau (Germany)

  • 8 Special Session: Spectroscopic Techniques in Industrial and

    Astronomical Applications

    Philipp Huke, Georg-August-Universität Göttingen (Germany)

  • 9 High-Resolution Profiling I

    Paul C. Montgomery, Université de Strasbourg (France)

  • 10 High-Resolution Profiling II

    Jürgen W. Czarske, TU Dresden (Germany)

  • 11 Joint Session I: High-Precision Measurement of Optical Components

    and Systems

    Christof Pruss, Institut für Technische Optik (Germany)

  • 12 Joint Session II: High-Precision Measurement of Optical Components

    and Systems

    Marcus Trost, Fraunhofer-Institut für Angewandte Optik und

    Feinmechanik (Germany)

  • 13 Speckle Metrology

    Sen Han, University of Shanghai for Science and Technology (China)

  • 14 In-situ and Nondestructive Testing I

    Changhe Zhou, Shanghai Institute of Optics and Fine Mechanics

    (China)

  • 15 In-situ and Nondestructive Testing II

    Wei-Chung Wang, National Tsing Hua University (Taiwan)

  • 16 In-situ and Nondestructive Testing III

    Armando Albertazzi Gonçalves Jr., Universidade Federal de Santa Catarina (Brazil)

Introduction

This year we celebrate the ten-year anniversary of the Optical Measurement Systems for Industrial Inspection Conference, which takes place in Munich, Germany. Once again, it is an essential part of the SPIE Optical Metrology Symposium and the World of Photonics Congress. As before, the conference covers applications of optical metrology in nearly all relevant fields of industrial production.

Even in times where scientific facts are sometimes ignored there is a broad consensus in science and technology that the acquisition of knowledge based on reliable data is the only option to create sustainable progress. Nowadays, optical metrology is one of the most important fields of measurement technology and is dedicated to collect data in order to control, assess, and improve industrial products and processes. Consequently, the Munich conference has established itself as an important international forum of scientific exchange and discussion of the latest results.

More than 180 submissions impressively demonstrate that even after 18 years the Munich conference series is a considerable event for researchers working in optical metrology all over the world. With more than 75 oral presentations and 90 posters, the 2017 conference could hold the highest number of submissions and an outstanding level of contributions that builds the basis of its success.

As in previous years, a significant number of contributions deal with optical measurement of geometrical features. A field of application of maintaining interest is the measurement of optical components, e.g. aspheres, free-form surfaces, and optical systems. Therefore, the traditional joint session took place with the EOS Conference on Manufacturing and Testing of Optical Components on Wednesday afternoon. Since spectroscopy seems to be of growing interest, even in industrial inspection, we included a Special Session called Spectroscopic Techniques in Industrial and Astronomical Applications on Tuesday afternoon.

As there are always individuals playing a key role and pushing things forward we would like to thank all authors, who not only fill the conference with life but also give added value by contributing to this proceedings volume. Special thanks are due to the distinguished invited speakers, namely John H. Bruning, Corning Tropel Corp. (United States), Robert Schmitt, RWTH Aachen (Germany), Changhe Zhou,

Shanghai Institute of Optics and Fine Mechanics (China), Paul C. Montgomery, Univ. de Strasbourg (France), James Millerd, 4D Technology Corp. (United States), Wei-Chung Wang, National Tsing Hua Univ. (Taiwan), and Alexis Mendez, Micron Optics, Inc. (United States) for their willingness to contribute to the conference with stimulating lectures.

We would also like to express our sincere gratitude to the members of the programme committee for their support in the run-up to the conference. Additionally, many thanks are due to the SPIE staff for their professional and cooperative work during the conference organisation and the preparation of this proceedings volume.

Peter Lehmann

Wolfgang Osten

Armando Albertazzi Gonçalves Jr.

© (2017) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
"Front Matter: Volume 10329", Proc. SPIE 10329, Optical Measurement Systems for Industrial Inspection X, 1032901 (29 June 2017); doi: 10.1117/12.2282982; https://doi.org/10.1117/12.2282982
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