26 June 2017 New method for probe position correction for Ptychography
Author Affiliations +
Abstract
For high resolution imaging, X-rays and electron beams are being used. However, for such a short wavelength, imaging with lenses becomes difficult as lenses absorb a part of radiation and lenses with very low aberrations must be used. Ptychography is a lens-less imaging technique which uses intensity information of the multiple diffraction patterns in the far field. These multiple far field diffraction patterns are generated by an unknown object which is scanned by a localized illuminated spot (probe).

Accurate knowledge of initial parameters is important for a good reconstruction of the object. Robustness of the Ptychography Iterative Engine (PIE) has already been studied for inaccurately known initial parameters, where the success of the algorithm was found to be sensitive to the accuracy of the estimate of lateral positions of the probe.
:; We present here a new method to correct the lateral position of the probe with respect to the object. This method is more straightforward to implement than other existing algorithms while comparable accuracy for the lateral position is achieved. Being able to correct the probe positions has positive implication in experiments, in particular at the short wavelength cases. It relaxes the requirement for the experimental set-up.
© (2017) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
P. Dwivedi, A. P. Konijnenberg, S. F. Pereira, H. P. Urbach, "New method for probe position correction for Ptychography", Proc. SPIE 10329, Optical Measurement Systems for Industrial Inspection X, 103292Y (26 June 2017); doi: 10.1117/12.2270165; https://doi.org/10.1117/12.2270165
PROCEEDINGS
6 PAGES


SHARE
RELATED CONTENT

Phase retrieval for crystalline specimens
Proceedings of SPIE (September 06 2017)
A unified phase retrieval algorithm for both far field and...
Proceedings of SPIE (September 06 2006)
Phase Retrieval From Fourier Intensity Data
Proceedings of SPIE (January 29 1988)
Phase retrieval from undersampled intensity data
Proceedings of SPIE (October 31 1997)

Back to Top