Steps towards traceability for an asphere interferometer

I. Fortmeier; M. Stavridis; C. Elster; M. Schulz

doi:10.1117/12.2269122

26 June 2017 Steps towards traceability for an asphere interferometer

I. Fortmeier, M. Stavridis, C. Elster, M. Schulz

Proceedings Volume 10329, Optical Measurement Systems for Industrial Inspection X; 1032939 (2017) https://doi.org/10.1117/12.2269122
Event: SPIE Optical Metrology, 2017, Munich, Germany

Abstract

Optical systems have increased in quality and capability and are today widely used in many fields of applications. An important step forward was the introduction of aspheres and freeform surfaces. For manufacturing these surfaces in high quality, the accurate measurement of them is highly important. A reliable measurement requires traceability. The concept of traceability is presented, uncertainty sources are itemized and the steps towards traceability for an asphere interferometer are discussed.

Citation Download Citation

I. Fortmeier, M. Stavridis, C. Elster, and M. Schulz "Steps towards traceability for an asphere interferometer", Proc. SPIE 10329, Optical Measurement Systems for Industrial Inspection X, 1032939 (26 June 2017); https://doi.org/10.1117/12.2269122

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