26 June 2017 Steps towards traceability for an asphere interferometer
Author Affiliations +
Abstract
Optical systems have increased in quality and capability and are today widely used in many fields of applications. An important step forward was the introduction of aspheres and freeform surfaces. For manufacturing these surfaces in high quality, the accurate measurement of them is highly important. A reliable measurement requires traceability. The concept of traceability is presented, uncertainty sources are itemized and the steps towards traceability for an asphere interferometer are discussed.
© (2017) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
I. Fortmeier, I. Fortmeier, M. Stavridis, M. Stavridis, C. Elster, C. Elster, M. Schulz, M. Schulz, "Steps towards traceability for an asphere interferometer", Proc. SPIE 10329, Optical Measurement Systems for Industrial Inspection X, 1032939 (26 June 2017); doi: 10.1117/12.2269122; https://doi.org/10.1117/12.2269122
PROCEEDINGS
9 PAGES


SHARE
Back to Top