18 May 1989 New Convenient Method For The Determination Of Electro-Optic Constants Of Thin Films
Author Affiliations +
Proceedings Volume 1033, Trends in Quantum Electronics; (1989); doi: 10.1117/12.950635
Event: International Conference on Trends in Quantum Electronics, 1988, Bucharest, Romania
Abstract
A new method for the determination of the electro-optic constant is proposed and de-monstrated for polycarbonate films doped with 4-diethylamino-4'-nitrostilbene. Third-order nonlinear susceptibility x(3)(-w; w, 0,0) of the film was determined between 00 and 800 nm at room temperature by using this method. X(3)(-wi5,0, 0) is (64-4i)x10-12 esu or quadratic electro-optic constant is (-1-0.7i)x10-20 m2/1T2 at 597 nrn,
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Hisao Uchiki, Takayoshi Kobayashi, "New Convenient Method For The Determination Of Electro-Optic Constants Of Thin Films", Proc. SPIE 1033, Trends in Quantum Electronics, (18 May 1989); doi: 10.1117/12.950635; https://doi.org/10.1117/12.950635
PROCEEDINGS
3 PAGES


SHARE
KEYWORDS
Molecules

Electro optics

Polymers

Transmittance

Thin films

Motion models

Aluminum

Back to Top