26 June 2017 Increase in the measurement of the normal vectors of an aspherical surface used in deflectometry
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Abstract
We present the numerical simulation of a ray selector with a uniform distribution. This selector shall be used in a deflectometry arrangement and the detection plane of spots necessary in the deflectometry shall be placed at an arbitrary distance from the lens under test. To perform this task, the vector form of the exact ray tracing is used through a lens and from these positions determine the shape of the convex surface of the lens. This program is flexible and can be used on other types of optical surfaces, and different ray distribution, including null distribution. The first preliminary results are shown below.
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Diana Castán-Ricaño, Diana Castán-Ricaño, Fermín S. Granados-Agustín, Fermín S. Granados-Agustín, E. Percino-Zacarías, E. Percino-Zacarías, A. Cornejo-Rodríguez, A. Cornejo-Rodríguez, } "Increase in the measurement of the normal vectors of an aspherical surface used in deflectometry", Proc. SPIE 10330, Modeling Aspects in Optical Metrology VI, 103301W (26 June 2017); doi: 10.1117/12.2271872; https://doi.org/10.1117/12.2271872
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